Christian Schober

C. Schober, L. Lausmann, K. Treptow, C. Pruss, and S. Reichelt, “Complex illumination system for fast interferometric measurements,” in EPJ Web of Conferences, B. Kibler, G. Millot, and P. Segonds, Eds., in EPJ Web of Conferences, vol. 287. EDP Sciences, 2023, p. 02002. doi: 10.1051/epjconf/202328702002.

S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Field evaluation of a novel holographic single-image depth reconstruction sensor,” Journal of the European Optical Society-Rapid Publications, vol. 19, no. 1, Art. no. 1, 2023, doi: 10.1051/jeos/2023017.

C. Schober, L. Lausmann, K. Treptow, C. Pruss, and S. Reichelt, “Neue Designmöglichkeiten durch Zweiphotonenlithographie für ein RGB-Interferometer-Beleuchtungsmodul,” DGaO Proceedings, 2023.

S. Fischer Calderón et al., Absolute determination of a large mirror surface from spatial gradients using a coordinate measuring machine, vol. 12672. in Proc. SPIE, vol. 12672. SPIE, 2023. doi: http://dx.doi.org/10.1117/12.2675734.

S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Bildbasierte Abstandsrekonstruktion mittels holographisch vervielfältigter Doppel-Helix-PSF,” DGaO-Proceedings 2022, 2022.

K. Treptow, C. Schober, C. Pruss, A. Herkommer, and S. Reichelt, “Single-shot Interferometry apart from zero position measurement,” DGaO Proceedings, 2022.

S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Holographic single-image depth reconstruction,” in EPJ Web of Conferences, M. F. Costa, M. Flores-Arias, G. Pauliat, and P. Segonds, Eds., in EPJ Web of Conferences, vol. 266. EDP Sciences, 2022, p. 10005. doi: 10.1051/epjconf/202226610005.

C. Schober, R. Beisswanger, A. Gronle, C. Pruss, and W. Osten, “Tilted Wave Fizeau Interferometer for flexible and robust asphere and freeform testing,” Light: Advanced Manufacturing, vol. 3, no. 4, Art. no. 4, 2022, doi: 10.37188/lam.2022.048.

C. Schober, C. Pruss, and A. Herkommer, “Ereignisbasierte Weißlichtinterferometrie (eCSI),” tm - Technisches Messen, vol. 89, no. 6, Art. no. 6, 2022, doi: doi:10.1515/teme-2021-0130.

S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Accurate single image depth detection using multiple rotating point spread functions,” Optics Express, vol. 30, no. 13, Art. no. 13, Jun. 2022, doi: 10.1364/oe.458541.

Y. Arezki et al., “Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level,” Sensors, vol. 21, no. 4, Art. no. 4, 2021, doi: 10.3390/s21041103.

C. Schober, C. Pruss, and A. Herkommer, “Integriertes Messkonzept zur Registrierung von Weißlichtinterferometriesignalen für Nanometrologie in großen Messvolumina,” DGaO Proceedings, 2021.

C. Schober, C. Pruss, A. Faulhaber, and A. Herkommer, “Event based coherence scanning interferometry,” Optics Letters, vol. 46, no. 17, Art. no. 17, Aug. 2021, doi: 10.1364/ol.437489.

C. Schober, C. Pruß, and A. Herkommer, “Sensordesign für die NPMM-200 am Beispiel eines Weisslichtsensors,” DGaO Proceedings, 2020.

C. Schober, C. Pruss, A. Herkommer, and W. Osten, “The NPMM-200: large area high resolution for freeform surface measurement,” in Seventh European Seminar on Precision Optics Manufacturing, O. W. Fähnle, G. Fütterer, R. Rascher, and A. Haberl, Eds., in Seventh European Seminar on Precision Optics Manufacturing, vol. 11478. SPIE, 2020, p. 1147807. doi: 10.1117/12.2564918.

C. Pruß and C. Schober, “Einzelbild-Tilted Wave Interferometer,” Nov. 20, 2020 [Online]. Available: https://worldwide.espacenet.com/patent/search?q=pn%3DDE102020130814A1

R. Beisswanger, C. Pruss, C. Schober, A. Harsch, and W. Osten, “Tilted wave interferometer in common path configuration: challenges and realization,” in Optical Measurement Systems for Industrial Inspection XI, P. Lehmann, W. Osten, and A. A. G. Jr., Eds., in Optical Measurement Systems for Industrial Inspection XI, vol. 11056. SPIE, 2019, p. 110561G. doi: 10.1117/12.2526175.