Dieses Bild zeigt Stephan Reichelt

Stephan Reichelt

Herr Prof. Dr.-Ing.

Institutsleiter
Institut für Technische Optik

Kontakt

Pfaffenwaldring 9
70569 Stuttgart
Deutschland
Raum: 1.234

Sprechstunde

Donnerstag, 11:30 - 12:30 Uhr, Raum 1.236

Bitte per E-Mail anfragen, weitere Termine nach Vereinbarung.

  1. 2025

    1. J. Rühle et al., “Polarization Camera based Fringe Locking Control of a Writing Head for Scanning Beam Interference Lithography,” in 2025 American Control Conference (ACC), Jul. 2025, pp. 3254–3259. doi: 10.23919/ACC63710.2025.11107550.
    2. A. Savchenko, C. Pruß, A. Herkommer, and S. Reichelt, “Effect of sample thickness on etching rate: Simulations and experiments,” Journal of the European Optical Society-Rapid Publications, vol. 21, Art. no. 2, 2025, doi: 10.1051/jeos/2025049.
    3. P.-E. Hansen et al., “Digital Twins for 3D Confocal Microscopy: Near-Field, Far-Field, and Comparison with Experiments,” Sensors, vol. 25, Art. no. 7, Mar. 2025, doi: 10.3390/s25072001.
    4. A. Rüdinger et al., “Bimodal tissue differentiation using hyperspectral imaging and elastographic Fourier transform profilometry,” Light: Advanced Manufacturing, vol. 6, Art. no. 0, 2025, doi: 10.37188/lam.2025.073.
    5. I. Ortlepp et al., “Enhanced Vectorial Measurement Uncertainty Model,” Metrology, vol. 5, Art. no. 2, Apr. 2025, doi: 10.3390/metrology5020019.
    6. M. Zimmermann, A. Brenner, T. Haist, and S. Reichelt, “Improved far field holograms using spatial light modulators and camera-in-the-loop optimization,” in Digital Optical Technologies 2025, B. C. Kress and J. W. Czarske, Eds., in Proc. SPIE, vol. 13573. SPIE, Aug. 2025, p. 1357304. doi: 10.1117/12.3063849.
    7. A. Savchenko, C. Pruß, A. Herkommer, and S. Reichelt, “Effect of substrate thickness on the etching rate of diffractive optical elements,” in DGaO Proceedings 2025, DGaO, Ed., 2025. [Online]. Available: https://www.dgao-proceedings.de/download/126/126_b35.pdf
    8. L. Fu, X. Wang, K. Frenner, and S. Reichelt, “Efficient deep-learning ResNet architectures for Mueller-matrix Fourier scatterometry,” 2025, p. 1356807. doi: https://doi.org/10.1117/12.3066282.
    9. S. Wyss, W. Matthias, B. Bodermann, S. Gao, L. Fu, and S. Reichelt, “Comparison of two fit algorithms to find the maximum of a simulated confocal intensity curve,” 2025, p. 135680Y. doi: https://doi.org/10.1117/12.3066343.
    10. H. Hooshmand et al., “Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology,” Journal of Computational Physics, vol. 521, p. 113519, Jan. 2025, doi: 10.1016/j.jcp.2024.113519.
    11. A. Rüdinger et al., “Spektrale Analyse von malignem und gesundem Gewebe basierend auf hyperspektralen Bilddaten,” in DGaO Proceedings, DGaO, Sep. 2025. [Online]. Available: https://www.dgao-proceedings.de/
    12. S. Hartlieb, A. Zeller, T. Haist, A. Reichardt, C. Tarín Sauer, and S. Reichelt, “Advanced Imaging‐Based Metrology for Precise Deformation Monitoring: Railway Bridge Case Study,” Structural Control and Health Monitoring, vol. 2025, Art. no. 1, Jan. 2025, doi: 10.1155/stc/5603393.
    13. P. Laux, A. Schiller, C. Bett, A. Bertz, D. Carl, and S. Reichelt, “Influence of object motion on roughness measurements using spectral speckle correlation,” Optics Express, vol. 33, Art. no. 23, Nov. 2025, doi: 10.1364/oe.578858.
    14. K. Leonhardt, K. Frenner, and S. Reichelt, “Weiterentwicklung und neue Anwendungen der Ellipso-Höhentopometrie EHT,” in DGaO Proceedings 2025, DGaO, Ed., 2025. [Online]. Available: https://www.dgao-proceedings.de/download/126/126_p26.pdf
    15. P. Laux, A. Bertz, D. Carl, and S. Reichelt, “Large area roughness measurements using spectral speckle correlation,” Optical engineering, vol. 64, Art. no. 7, 2025, doi: https://doi.org/10.1117/1. OE.64.7.074101.
    16. A. Schiebelbein, T. Schmitt-Manderbach, C. Glasenapp, S. Reichelt, and G. Pedrini, “Auflösungssteigerung in der digitalen Holographie durch adaptive Speckle-Beleuchtung,” in DGaO Proceedings 2025, DGaO, Ed., 2025. [Online]. Available: https://www.dgao-proceedings.de/download/126/126_a1.pdf
    17. S. Reichelt and E. Istrate, “Principles of display holography,” in Handbook of Visual Display Technology, K. Blankenbach, Q. Yan, and R. J. O’Brien, Eds., Springer, 2025, pp. 1–29. doi: https://doi.org/10.1007/978-3-642-35947-7_225-1.
    18. C. Ryan, T. Haist, and S. Reichelt, “Holographic detection for fast fringe projection profilometry of deep micro-scale objects,” Optics Express, vol. 33, Art. no. 1, Jan. 2025, doi: 10.1364/oe.549266.
    19. A. Brenner, M. Zimmermann, T. Haist, and S. Reichelt, “Kalibrierung von Lichtmodulatoren mit physikalisch interpretierbaren neuronalen Netzen,” in DGaO Proceedings 2025, Sep. 2025. [Online]. Available: https://www.dgao-proceedings.de/download/126/126_n1.pdf
    20. M. Zimmermann, A. Brenner, T. Haist, and S. Reichelt, “Experimentelle Demonstration der Specklereduktion in Fernfeldhologrammen von SLMs durch hochgenaue Camera-in-the-loop Kalibrierung,” in DGaO Proceedings 2025, 2025. [Online]. Available: https://www.dgao-proceedings.de/download/126/126_a23.pdf
    21. V. Neu, G. Pedrini, I. Soldatov, S. Reichelt, and R. Schäfer, “Lensless magneto-optical imaging,” Scientific Reports, vol. 15, Art. no. 1, Aug. 2025, doi: 10.1038/s41598-025-10005-1.
  2. 2024

    1. A. Birk, K. Frenner, and S. Reichelt, “Time-gated single pixel camera: an innovative sensor for object detection through scattering media,” in Proc. SPIE PC12900, Emerging Digital Micromirror Device Based Systems and Applications XVI, SPIE, Mar. 2024, p. PC1290006. doi: 10.1117/12.3008604.
    2. M. Zimmermann, T. Haist, and S. Reichelt, “Berechnungsmethoden für Fernfeldhologramme – Gerchberg-Saxton Erweiterungen und Stochastic Gradient Descent Optimierer,” in DGaO Proceedings 2024, 2024. [Online]. Available: https://www.dgao-proceedings.de/download/125/125_a28.pdf
    3. C. Ryan, T. Haist, G. Laskin, S. Schröder, and S. Reichelt, “Technology Selection for Inline Topography Measurement with Rover-Borne Laser Spectrometers,” Sensors, vol. 24, Art. no. 9, 2024, doi: 10.3390/s24092872.
    4. G. Kanagalingam et al., “Quasi Time-Optimal Path Tracking for Pneumatic Robots Considering Third-Order Actuator Constraints,” in 2024 American Control Conference (ACC), Jul. 2024, pp. 5258–5263. doi: 10.23919/ACC60939.2024.10644892.
    5. C. Schober, C. Pruß, A. Herkommer, and S. Reichelt, “Ultimate measurement speed for flexible asphere and freeform metrology: TWISS,” in Optical Instrument Science, Technology, and Applications III, SPIE, 2024, p. 1302402. doi: 10.1117/12.3025161.
    6. K. Doth, T. Haist, and S. Reichelt, “Towards pathogen detection with 3D-printed micro-optics in microfluidic systems,” in Proc. SPIE 12876, Laser 3D Manufacturing XI, Mar. 2024, p. 128760K. doi: 10.1117/12.3008437.
    7. M. Zimmermann and S. Reichelt, “Computational hologram optimization for large holographic displays using eye pupil position,” in Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V, N. Argaman, H. Hua, and D. K. Nikolov, Eds., SPIE, 2024, p. 129131C. doi: 10.1117/12.3000198.
    8. A. Birk, C. Bett, K. Frenner, and S. Reichelt, “Die Time-Gated Single Pixel Camera (TGSPC): Innovatives Konzept zur Objekterkennung durch streuende Medien,” in DGaO Proceedings 2024, DGaO, Ed., 2024. [Online]. Available: https://www.dgao-proceedings.de/abstract/abstract_only.php?id=3091
    9. G. Pedrini, R. Li, L. Cao, and S. Reichelt, “Lensless imaging in one shot using the complex degree of coherence obtained by multiaperture interferences,” Optics Letters, vol. 49, Art. no. 3, Jan. 2024, doi: 10.1364/ol.511547.
    10. P. Laux, A. Schiller, A. Bertz, D. Carl, and S. Reichelt, “Spectral speckle displacement in defocused and tilted imaging systems,” Optics Express, vol. 32, Art. no. 10, Apr. 2024, doi: 10.1364/oe.516122.
    11. S. Hartlieb, Z. Wang, A. Rüdinger, T. Haist, and S. Reichelt, “Large dynamic range Shack–Hartmann wavefront sensor based on holographic multipoint generation and pattern correlation,” Optical Engineering, vol. 63, Art. no. 2, 2024, doi: 10.1117/1.OE.63.2.024107.
    12. A. Rüdinger, T. Haist, and S. Reichelt, “Hyperspectral measurement system for characterization of healthy and malignant tissue spectra,” in DGaO Proceedings, DGaO, Aug. 2024, p. P19. [Online]. Available: https://www.dgao-proceedings.de/download/125/125_p19.pdf
    13. C. Schober, C. Pruß, and S. Reichelt, “Single-Shot Tilted-Wave-Interferometer,” in DGaO Proceedings 2024, DGaO, Ed., 2024. [Online]. Available: https://www.dgao-proceedings.de/abstract/abstract_only.php?id=3052
    14. A. Gröger, R. Kuschmierz, A. Birk, G. Pedrini, and S. Reichelt, “Two-wavelength holographic micro-endoscopy,” Optics Express, vol. 32, Art. no. 13, Jun. 2024, doi: 10.1364/oe.527958.
    15. P.-E. Hansen et al., “Digital twins for 3D confocal microscopy,” in Proc. SPIE 12997, Optics and Photonics for Advanced Dimensional Metrology III, SPIE, Jun. 2024, p. 129970M. doi: 10.1117/12.3016808.
  3. 2023

    1. A. Gröger et al., “World’s smallest single-shot two-wavelength holographic endoscope for 3D surface measurement,” in Endoscopic Microscopy XVIII, G. J. T. M.D., T. D. Wang, and M. J. Suter, Eds., SPIE, 2023, p. PC123560P. doi: 10.1117/12.2662817.
    2. C. M. Bett, K. Frenner, S. Reichelt, and W. Osten, “Towards image-free object detection for autonomous vehicles under harsh environmental conditions,” in Optical Measurement Systems for Industrial Inspection XIII, P. Lehmann, W. Osten, and A. A. G. Jr., Eds., SPIE, 2023, p. 126181C. doi: 10.1117/12.2675716.
    3. S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Field evaluation of a novel holographic single-image depth reconstruction sensor,” Journal of the European Optical Society-Rapid Publications, vol. 19, Art. no. 1, 2023, doi: 10.1051/jeos/2023017.
    4. C. Schober, L. Lausmann, K. Treptow, C. Pruss, and S. Reichelt, “Complex illumination system for fast interferometric measurements,” in EPJ Web of Conferences, B. Kibler, G. Millot, and P. Segonds, Eds., EDP Sciences, 2023, p. 2002. doi: 10.1051/epjconf/202328702002.
    5. P. Laux, A. Schiller, A. Bertz, D. Carl, and S. Reichelt, “Surface roughness measurement of large areas with high spatial resolution by spectral speckle correlation,” in Optical Measurement Systems for Industrial Inspection XIII, P. Lehmann, W. Osten, and A. Albertazzi Gonçalves, Eds., SPIE, Aug. 2023, p. 52. doi: 10.1117/12.2672865.
    6. C. Schober, L. Lausmann, K. Treptow, C. Pruss, and S. Reichelt, “Neue Designmöglichkeiten durch Zweiphotonenlithographie für ein RGB-Interferometer-Beleuchtungsmodul,” DGaO Proceedings, 2023.
    7. T. Haist, R. Hahn, and S. Reichelt, “Diffraction-based dual path multispectral imaging,” tm - Technisches Messen, 2023, doi: doi:10.1515/teme-2023-0007.
    8. R. Beisswanger, C. Pruss, and S. Reichelt, “Retrace error calibration for interferometric measurements using an unknown optical system,” Opt. Express, vol. 31, Art. no. 17, Aug. 2023, doi: 10.1364/OE.496059.
    9. J. Baumgärtner et al., “Increasing robot precision by stroke division,” in 2023 27th International Conference on Methods and Models in Automation and Robotics (MMAR), IEEE, Aug. 2023, pp. 205–210. doi: 10.1109/MMAR58394.2023.10242468.
    10. E. Istrate, G. Pedrini, and S. Reichelt, “Lensless microscopy by multiplane recordings: sub-micrometer, diffraction-limited, wide field-of-view imaging,” Optics Express, vol. 31, Art. no. 22, Oct. 2023, doi: 10.1364/oe.503944.
    11. J. Baumgärtner et al., “Camera Placement Optimization for a Novel Modular Robot Tracking System,” in 2023 IEEE SENSORS, IEEE, Oct. 2023, pp. 1–4. doi: 10.1109/SENSORS56945.2023.10324941.
    12. S. Reichelt and G. Pedrini, “Digital Holography vs. Display Holography - What are their differences and what do they have in common?,” in Proceedings of the 2023 6th International Conference on Machine Vision and Applications, in ICMVA ’23. Singapore, Singapore: Association for Computing Machinery, Jun. 2023, pp. 72–80. doi: 10.1145/3589572.3589583.
    13. S. Wyss et al., “Rigorous modeling of a confocal microscope,” in Modeling Aspects in Optical Metrology IX, B. M. Barnes, B. Bodermann, and K. Frenner, Eds., SPIE, Aug. 2023, p. 37. doi: 10.1117/12.2673784.
    14. A. Gröger, G. Pedrini, F. Fischer, D. Claus, I. Aleksenko, and S. Reichelt, “Two-wavelength digital holography through fog,” Journal of the European Optical Society-Rapid Publications, vol. 19, Art. no. 1, 2023, doi: 10.1051/jeos/2023024.
    15. A. Gröger, G. Pedrini, D. Claus, and S. Reichelt, “Coherence-gated digital holographic imaging through extended scattering media for autonomous driving vehicles,” in Optical Measurement Systems for Industrial Inspection XIII, P. Lehmann, W. Osten, and A. Albertazzi Gonçalves, Eds., SPIE, Aug. 2023, p. 50. doi: 10.1117/12.2675717.
  4. 2022

    1. A. Groeger, G. Pedrini, D. Claus, I. Alekseenko, F. Gloeckler, and S. Reichelt, “Coherence-gated digital holographic imaging through fog,” in Digital Holography and 3-D Imaging 2022, Optica Publishing Group, 2022, p. M2A. doi: 10.1364/DH.2022.M2A.2.
    2. S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Bildbasierte Abstandsrekonstruktion mittels holographisch vervielfältigter Doppel-Helix-PSF,” DGaO-Proceedings 2022, 2022.
    3. R. Li, G. Pedrini, Z. Huang, S. Reichelt, and L. Cao, “Physics-enhanced neural network for phase retrieval from two diffraction patterns,” Opt. Express, vol. 30, Art. no. 18, Aug. 2022, doi: 10.1364/OE.469080.
    4. R. Hahn, J. Görres, T. Haist, W. Osten, and S. Reichelt, “Novel snapshot hyperspectral imager based on diffractive elements,” in Optical Sensing and Detection VII, F. Berghmans and I. Zergioti, Eds., SPIE, 2022, p. 121390I. doi: 10.1117/12.2621521.
    5. K. Treptow, C. Schober, C. Pruss, A. Herkommer, and S. Reichelt, “Single-shot Interferometry apart from zero position measurement,” DGaO Proceedings, 2022.
    6. S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Holographic single-image depth reconstruction,” in EPJ Web of Conferences, M. F. Costa, M. Flores-Arias, G. Pauliat, and P. Segonds, Eds., EDP Sciences, 2022, p. 10005. doi: 10.1051/epjconf/202226610005.
    7. S. Hartlieb, M. Boguslawski, T. Haist, and S. Reichelt, “Holographical image based vibrometry with monochromatic and event based cameras,” in Optics and Photonics for Advanced Dimensional Metrology II, P. J. de Groot, R. K. Leach, and P. Picart, Eds., SPIE, 2022, p. 1213702. doi: 10.1117/12.2621973.
    8. S. Hartlieb, C. Schober, T. Haist, and S. Reichelt, “Accurate single image depth detection using multiple rotating point spread functions,” Optics Express, vol. 30, Art. no. 13, Jun. 2022, doi: 10.1364/oe.458541.
    9. R. Beisswanger, M. Weckerle, C. Pruss, and S. Reichelt, “Interferometric radius of curvature measurements: an environmental error treatment,” Optics Express, vol. 30, Art. no. 14, Jul. 2022, doi: 10.1364/oe.461972.
  5. 2019

    1. S. Reichelt, “Decomposition of non-rotationally symmetric wavefront aberrations into their azimuthal orders,” in Applied Optical Metrology III, E. Novak and J. D. Trolinger, Eds., SPIE, 2019, p. 111020B. doi: 10.1117/12.2528169.
  6. 2016

    1. E. Zschau and S. Reichelt, “Head- and Eye-Tracking Solutions for Autostereoscopic and Holographic 3D Displays,” in Handbook of Visual Display Technology, J. Chen, W. Cranton, and M. Fihn, Eds., Cham: Springer International Publishing, 2016, pp. 2625–2649. doi: 10.1007/978-3-319-14346-0_114.
1997 Dipl.-Ing. Maschinenbau an der Universität Stuttgart
2004 Promotion zum Dr.-Ing. an der Universität Stuttgart mit der Dissertation „Inter­ferometri­sche Optikprüfung mit computergenerierten Hologrammen“
2003–2006 Post Doc / Wissenschaftlicher Assistent an der Universität Freiburg, Institut für Mikro­system­technik (IMTEK)
2007–2012 Head of Applications bei SeeReal Technologies, Dresden
2013–2021 Entwicklungsleiter bei der SwissOptic AG, Heerbrugg, Schweiz
seit 10/2021 Universitätsprofessor und Leiter des Instituts für Technische Optik (ITO) an der Fakultät 7: Konstruktions-, Produktions- und Fahrzeugtechnik der Universität Stuttgart

 

Zum Seitenanfang