Reviewed Papers

Auf dieser Seite finden sie die reviewed Papers des ITO.

Publications

  1. 2019

    1. T. Haist, C. Reichert, F. Würtenberger, L. Lachenmaier, and A. Faulhaber, “Kamerabasierte Erfassung von Vitalparametern,” tm-Technisches Messen, 2019.
    2. M. Liao, D. Lu, W. He, G. Pedrini, W. Osten, and X. Peng, “Improving reconstruction of speckle correlation imaging by using a modified phase retrieval algorithm with the number of nonzero-pixels constraint,” Appl. Opt., vol. 58, no. 2, pp. 473--478, 2019.
    3. G. Pedrini, I. Alekseenko, G. Jagannathan, M. Kempenaars, G. Vayakis, and W. Osten, “Feasibility study of digital holography for erosion measurements under extreme environmental conditions inside the International Thermonuclear Experimental Reactor tokamak \invited\,” Appl. Opt., vol. 58, no. 5, pp. A147--A155, 2019.
    4. J. Ritter, N. Ma, W. Osten, M. Takeda, and W. Wang, “Depolarizing surface scattering by a birefringent material with rough surface,” Optics Communications, vol. 430, pp. 456--460, 2019.
    5. F. Würtenberger, T. Haist, C. Reichert, A. Faulhaber, T. Boettcher, and A. Herkommer, “Optimum Wavelengths in the Near Infrared for Imaging Photoplethysmography.,” IEEE Trans. Biomed. Engineering, vol. 66, no. 10, pp. 2855–2860, 2019.
    6. F. Würtenberger, T. Haist, C. Reichert, A. Faulhaber, T. Böttcher, and A. Herkommer, “Optimum wavelengths in the near infrared for imaging photoplethysmography,” IEEE Transactions on Biomedical Engineering, 2019.
  2. 2018

    1. E. Achimova, V. Abaskin, D. Claus, G. Pedrini, I. Shevkunov, and V. Katkovnik, “Noise minimized high resolution digital holographic microscopy applied to surface topography,” Computer Optics, vol. 42, pp. 267–272, Mar. 2018.
    2. D. Buchta, C. Heinemann, G. Pedrini, C. Krekel, and W. Osten, “Combination of FEM simulations and shearography for defect detection on artwork,” STRAIN, vol. 54, no. 3, 2018.
    3. D. Buchta, H. Serbes, D. Claus, G. Pedrini, and W. Osten, “Soft tissue elastography via shearing interferometry,” JOURNAL OF MEDICAL IMAGING, vol. 5, no. 4, 2018.
    4. Z. Cai et al., “Light-field-based absolute phase unwrapping,” OPTICS LETTERS, vol. 43, no. 23, pp. 5717–5720, 2018.
    5. V. Cazac et al., “Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography,” APPLIED OPTICS, vol. 57, no. 3, pp. 507–513, 2018.
    6. D. Claus, G. Pedrini, D. Buchta, and W. Osten, “Accuracy enhanced and synthetic wavelength adjustable optical metrology via spectrally resolved digital holography,” JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND  VISION, vol. 35, no. 4, pp. 546–552, 2018.
    7. T. Dietrich et al., “Thin-disk oscillator delivering radially polarized beams with up to 980 W of CW output power,” Optics Letters, vol. 43, no. 6, 2018.
    8. H. Li, L. Fu, K. Frenner, and W. Osten, “Cascaded DBR plasmonic cavity lens for far-field subwavelength imaging at a visible wavelength,” Optics Express, vol. 26, no. 15, pp. 19574–19582, 2018.
    9. H. Li, L. Fu, K. Frenner, and W. Osten, “Cascaded plasmonic superlens for far-field imaging with magnification at visible wavelength,” Optics Express, vol. 26, no. 8, pp. 10888–10897, 2018.
    10. F. Schaal et al., “Optically addressed modulator for tunable spatial polarization control,” Opt. Express, vol. 26, no. 21, pp. 28119--28130, 2018.
    11. A. Toulouse, S. Thiele, H. Giessen, and A. Herkommer, “Alignment-free integration of apertures and non-transparent hulls into 3D-printed micro-optics,” Opt. Lett., vol. 43, no. 5283, 2018.
    12. M. Zhou, A. K. Singh, G. Pedrini, W. Osten, J. Min, and B. Yao, “Tunable output-frequency filter algorithm for imaging through scattering media under LED illumination,” Optics Communications, vol. 410, pp. 160--163, 2018.
  3. 2017

    1. P. P. Banerjee, W. Osten, P. Picart, L. Cao, and G. Nehmetallah, “Digital Holography and 3D Imaging: introduction to the joint feature    issue in Applied Optics and Journal of the Optical Society of America B,” APPLIED OPTICS, vol. 56, no. 13, pp. DH1–DH4, 2017.
    2. P. P. Banerjee, W. Osten, P. Picart, L. Cao, and G. Nehmetallah, “Digital Holography and 3D Imaging: introduction to the joint feature issue in Applied Optics and Journal of the Optical Society of America B,” Appl. Opt., vol. 56, no. 13, pp. DH1--DH4, 2017.
    3. A. Bielke, C. Pruss, and W. Osten, “Design of a variable diffractive zoom lens for interferometric purposes,” Optical Engineering, vol. 56, no. 1, p. 014104, 2017.
    4. B. Bilski, K. Frenner, and W. Osten, “Effective-CD: A contribution toward the consideration of line edge roughness in the scatterometric critical dimension metrology,” Journal of Micro/Nanolithography, MEMS, and MOEMS, vol. 16, no. 2, p. 024002, May 2017.
    5. T. Boettcher, M. Gronle, and W. Osten, “Multi-layer topography measurement using a new hybrid single-shot technique: Chromatic Confocal Coherence Tomography (CCCT),” Opt. Express, vol. 25, no. 9, pp. 10204--10213, 2017.
    6. B. Chen and A. Herkommer, “Alternate optical designs for head-mounted displays with a wide field of view,” Applied Optics, vol. 56, no. 4, pp. 901–906, Feb. 2017.
    7. D. Claus et al., “Large-field-of-view optical elastography using digital image correlation for biological soft tissue investigation (erratum),” Journal of Medical Imaging, vol. 4, no. 014505, Jun. 2017.
    8. D. Claus, C. Reichert, and A. Herkommer, “Focus and perspective adaptive digital surgical microscope:optomechanical design and experimental implementation,” JOURNAL OF BIOMEDICAL OPTICS, vol. 22, no. 5, p. 056007, May 2017.
    9. D. Claus, G. Pedrini, and W. Osten, “Iterative phase retrieval based on variable wavefront curvature,” APPLIED OPTICS, vol. 56, no. 13, pp. F134–F137, 2017.
    10. M. Eckerle et al., “High-power single-stage single-crystal Yb:YAG fiber amplifier for radially polarized ultrashort laser pulses,” Applied Physics B, vol. 123, p. 123: 139, Apr. 2017.
    11. S. Fischbach et al., “Single Quantum Dot with Microlens and 3D-Printed Micro-objective as Integrated Bright Single-Photon Source,” ACS PHOTONICS, vol. 4, no. 6, pp. 1327–1332, 2017.
    12. B. Frank et al., “Short-range surface plasmonics: Localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surface,” Science Advances, vol. 3, no. 7, 2017.
    13. S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten, “Reduction of chromatic dispersion using multiple carrier frequency patterns in SLM-based microscopy,” APPLIED OPTICS, vol. 56, no. 23, pp. 6688–6693, 2017.
    14. R. Hahn, J. Krauter, K. Körner, M. Gronle, and Wolfgang. Osten, “Single-shot low coherence pointwise measuring interferometer with    potential for in-line inspection,” MEASUREMENT SCIENCE AND TECHNOLOGY, vol. 28, no. 2, 2017.
    15. J. Krauter and W. Osten, “Nondestructive surface profiling of hidden MEMS by an infrared low-coherence interferometric microscope,” Surface Topography: Metrology and Properties, vol. 6, Dec. 2017.
    16. J. Liu, D. Claus, T. Xu, T. Kessner, A. Herkommer, and W. Osten, “Light field endoscopy and its parametric description,” OPTICS LETTERS, vol. 42, no. 9, pp. 1804–1807, 2017.
    17. C. S. Narayanamurthy, G. Pedrini, and W. Osten, “Digital holographic photoelasticity,” APPLIED OPTICS, vol. 56, no. 13, pp. F213–F217, 2017.
    18. C. Pruss, G. Bastian Baer, J. Schindler, and W. Osten, “Measuring aspheres quickly: Tilted wave interferometry,” Optical Engineering, vol. 56, no. 11, p. 111713, Jul. 2017.
    19. D. Rausch, M. Rommel, A. Herkommer, and T. Talpur, “Illumination design for extended sources based on phase space mapping,” OPTICAL ENGINEERING, vol. 56, no. 6, 2017.
    20. S. Schmidt, S. Thiele, A. Herkommer, A. Tuennermann, and H. Gross, “Rotationally symmetric formulation of the wave propagation method-application to the straylight analysis of diffractive lenses,” OPTICS LETTERS, vol. 42, no. 8, pp. 1612–1615, 2017.
    21. A. K. Singh, D. N. Naik, G. Pedrini, M. Takeda, and W. Osten, “Exploiting scattering media for exploring 3D objects,” LIGHT-SCIENCE & APPLICATIONS, vol. 6, 2017.
    22. A. K. Singh, G. Pedrini, W. Osten, and M. Takeda, “Diffraction-Limited Microscopy with a Simple Scatter Plate,” Optics & Photonics News, no. 46, 2017.
    23. A. K. Singh, G. Pedrini, M. Takeda, and W. Osten, “Scatter-plate microscope for lensless microscopy with diffraction limited resolution,” Scientific Reports, vol. 7, no. 1, pp. 10687--, 2017.
    24. S. Thiele, K. Arzenbacher, T. Gissibl, H. Giessen, and A. Herkommer, “3D-printed eagle eye: Compound microlens system for foveated imaging,” Science Advances, vol. 3, p. e1602655, Feb. 2017.
    25. K. Weber, F. Hütt, S. Thiele, T. Gissibl, A. Herkommer, and H. Giessen, “Single mode fiber based delivery of OAM light by 3D direct laser writing,” Opt. Express, vol. 25, no. 17, pp. 19672--19679, 2017.
    26. H. Yang, T. Haist, M. Gronle, and W. Osten, “Simulation of microscopic metal surfaces based on measured microgeometry,” TM-TECHNISCHES MESSEN, vol. 84, no. 7–8, pp. 493–501, 2017.
    27. M. Zhou, A. K. Singh, G. Pedrini, W. Osten, J. Min, and B. Yao, “Speckle-correlation imaging through scattering media with hybrid bispectrum-iteration algorithm,” OPTICAL ENGINEERING, vol. 56, no. 12, 2017.
  4. 2016

    1. J. Albero et al., “Wafer-level fabrication of multi-element glass lenses: lens doublet with improved optical performances,” OPTICS LETTERS, vol. 41, no. 1, pp. 96–99, 2016.
    2. M. Blattmann et al., “Bimodal endoscopic probe combining white-light microscopy and optical    coherence tomography,” APPLIED OPTICS, vol. 55, no. 15, pp. 4261–4269, 2016.
    3. B. Chen and A. Herkommer, “Generalized Aldis theorem for calculating aberration contributions in freeform systems,” OPTICS EXPRESS, vol. 24, no. 23, pp. 26999–27008, 2016.
    4. B. Chen and A. Herkommer, “High order surface aberration contributions from phase space analysis of    differential rays,” OPTICS EXPRESS, vol. 24, no. 6, pp. 5934–5945, 2016.
    5. M. Eckerle et al., “Novel thin-disk oscillator concept for the generation of radially polarized femtosecond laser pulses,” OPTICS LETTERS, vol. 41, no. 7, pp. 1680–1683, 2016.
    6. I. Fortmeier, M. Stavridis, A. Wiegmann, M. Schulz, W. Osten, and C. Elster, “Evaluation of absolute form measurements using a tilted-wave interferometer,” OPTICS EXPRESS, vol. 24, no. 4, pp. 3393–3404, 2016.
    7. L. Fu et al., “Depolarization of a randomly distributed plasmonic meander metasurface characterized by Mueller matrix spectroscopic ellipsometry,” Optics Express, vol. 24, no. 24, pp. 28056–28064, 2016.
    8. W. Fuhl et al., “Non-intrusive practitioner pupil detection for unmodified microscope oculars,” COMPUTERS IN BIOLOGY AND MEDICINE, vol. 79, pp. 36–44, 2016.
    9. H. Gießen, T. Gissibl, S. Thiele, and A. Herkommer, “Das kleinste Endoskop der Welt per 3D-Druck,” vol. 47, no. 5, pp. 214–215, 2016.
    10. T. Gissibl, S. Thiele, A. Herkommer, and H. Gießen, “Two-photon direct laser writing of ultracompact multi-lens objectives,” NATURE PHOTONICS, vol. 10, no. 8, p. 554+, 2016.
    11. T. Gissibl, S. Thiele, A. Herkommer, and H. Giessen, “Sub-micrometre accurate free-form optics by three-dimensional printing    on single-mode fibres,” NATURE COMMUNICATIONS, vol. 7, 2016.
    12. M. Gronle and W. Osten, “View and sensor planning for multi-sensor surface inspection,” Surface Topography: Metrology and Properties, vol. 4, p. 024009, Apr. 2016.
    13. Y. Huang et al., “Absolute test for cylindrical surfaces using the conjugate differential    method,” OPTICAL ENGINEERING, vol. 55, no. 11, 2016.
    14. D. Khodadad, A. K. Singh, G. Pedrini, and M. Sjodahl, “Full-field 3D deformation measurement: comparison between speckle phase and displacement evaluation,” APPLIED OPTICS, vol. 55, no. 27, pp. 7735–7743, 2016.
    15. C. Lingel, T. Haist, and W. Osten, “Spatial-light-modulator-based adaptive optical system for the use of    multiple phase retrieval methods,” APPLIED OPTICS, vol. 55, no. 36, pp. 10329–10334, 2016.
    16. S. Mahajan et al., “Wide-Field Lensless 3D Imaging and Visualization of Micro-objects,” JOURNAL OF DISPLAY TECHNOLOGY, vol. 12, no. 11, pp. 1283–1289, 2016.
    17. G. Marc and O. Wolfgang, “Multi-scale referencing and coordinate unification of optical sensors in multi-axis machines,” Advanced Optical Technologies, vol. 5. pp. 389--, 2016.
    18. F. Mendoza Santoyo, M. Georges, P. Lehmann, W. Osten, and A. G. Armando, Jr., “Speckle Metrology,” OPTICAL ENGINEERING, vol. 55, no. 12, 2016.
    19. G. Pedrini et al., “Residual stress analysis of ceramic coating by laser ablation and digital holography,” Experimental mechanics, vol. 56, no. 5, pp. 683–701, 2016.
    20. S. Peterhänsel, M. L. Gödecke, K. Frenner, and W. Osten, “Phase-structured illumination as a tool to detect nanometer asymmetries,” JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, vol. 15, no. 4, 2016.
    21. F. Schaal, M. Rutloh, S. Weidenfeld, and W. Osten, “Spatially Tunable Polarization Devices,” 2016, pp. 197–216.
    22. A. K. Singh, G. Pedrini, X. Peng, and W. Osten, “Nanoscale measurement of in-plane and out-of-plane displacements of microscopic object by sensor fusion,” OPTICAL ENGINEERING, vol. 55, no. 12, 2016.
    23. M. Takeda, A. K. Singh, D. N. Naik, G. Pedrini, and W. Osten, “Holographic Correloscopy-Unconventional Holographic Techniques For Imaging a Three-Dimensional Object Through an Opaque Diffuser or Via a Scattering Wall: A Review,” IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, vol. 12, no. 4, pp. 1631–1640, 2016.
    24. T. Talpur and A. Herkommer, “Review of freeform TIR collimator design methods,” Advanced Optical Technologies, vol. 5, Jan. 2016.
    25. S. Thiele et al., “Design, simulation and 3D printing of complex micro-optics for imaging,” 2016 International Conference on Optical MEMS and Nanophotonics (OMN), pp. 1–2, 2016.
    26. S. Thiele, T. Gissibl, H. Gießen, and A. M. Herkommer, “Ultra-compact on-chip LED collimation optics by 3D femtosecond direct laser writing,” OPTICS LETTERS, vol. 41, no. 13, pp. 3029–3032, 2016.
    27. P. W. M. Tsang and W. Osten, “Digital Holography for Industrial Applications,” IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, vol. 12, no. 4, pp. 1560–1563, 2016.
    28. P. Weidmann, U. Weber, S. Schmauder, G. Pedrini, and W. Osten, “Numerical calculation of temperature and surface topology during a laser ablation process for ceramic coatings,” MECCANICA, vol. 51, no. 2, SI, pp. 279–289, 2016.
  5. 2015

    1. J. Albero et al., “Dense arrays of millimeter-sized glass lenses fabricated at wafer-level,” OPTICS EXPRESS, vol. 23, no. 9, pp. 11702–11712, 2015.
    2. S. M. Azzem, L. Bouamama, S. Simoens, and W. Osten, “Two beams two orthogonal views particle detection,” JOURNAL OF OPTICS, vol. 17, no. 4, 2015.
    3. D. Buchta, N. Hein, G. Pedrini, C. Krekel, and W. Osten, “Artwork Inspection by Shearography with Adapted Loading,” EXPERIMENTAL MECHANICS, vol. 55, no. 9, pp. 1691–1704, 2015.
    4. A. Faridian, V. F. Paz, K. Frenner, G. Pedrini, A. Den Boef, and W. Osten, “Phase-sensitive structured illumination to detect nanosized asymmetries    in silicon trenches,” JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, vol. 14, no. 2, 2015.
    5. H. Gilbergs, H. Fang, K. Frenner, and W. Osten, “Adaptive state observer and PD control for dynamic perturbations in    optical systems,” OPTICS EXPRESS, vol. 23, no. 4, pp. 4002–4011, 2015.
    6. T. Haist, A. Peter, and W. Osten, “Holographic projection with field-dependent aberration correction,” OPTICS EXPRESS, vol. 23, no. 5, pp. 5590–5595, 2015.
    7. T. Haist, M. Gronle, D. A. Bui, and W. Osten, “Holographic multipoint generation for sensing positions,” TM-TECHNISCHES MESSEN, vol. 82, no. 5, SI, pp. 273–279, 2015.
    8. T. Haist and W. Osten, “Holography using pixelated spatial light modulators-part 1: theory and    basic considerations,” JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, vol. 14, no. 4, 2015.
    9. T. Haist and W. Osten, “Holography using pixelated spatial light modulators-Part 2: applications,” JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, vol. 14, no. 4, 2015.
    10. M. Hasler, J. Stahl, T. Haist, and W. Osten, “Object field expansion in spatial light modulator-based phase contrast    microscopy,” OPTICAL ENGINEERING, vol. 54, no. 4, 2015.
    11. O. Kranz, R. D. Geckeler, A. Just, M. Krause, and W. Osten, “From plane to spatial angles: PTB’s spatial angle autocollimator calibrator,” Advanced Optical Technologies, vol. 0, Jan. 2015.
    12. S. Peterhaensel, H. Laamanen, J. Lehtolahti, M. Kuittinen, W. Osten, and J. Tervo, “Human color vision provides nanoscale accuracy in thin-film thickness characterization,” OPTICA, vol. 2, no. 7, pp. 627–630, 2015.
    13. S. Peterhänsel, M. L. Gödecke, V. F. Paz, K. Frenner, and W. Osten, “Detection of overlay error in double patterning gratings using phase-structured illumination,” Optics Express, vol. 23, no. 19, pp. 24246–24256, 2015.
    14. C. Reinhardt et al., “Design and fabrication of near- to far-field transformers by sub-100 nm two-photon polymerization,” vol. Optically Induced Nanostructures, no. de Gruyter, 2015, pp. 73–92.
    15. H. Suhr and A. M. Herkommer, “In situ microscopy using adjustment-free optics,” JOURNAL OF BIOMEDICAL OPTICS, vol. 20, no. 11, 2015.
    16. J. Zheng, G. Pedrini, P. Gao, B. Yao, and W. Osten, “Autofocusing and resolution enhancement in digital holographic    microscopy by using speckle-illumination,” JOURNAL OF OPTICS, vol. 17, no. 8, 2015.
  6. 2014

    1. A. Anand et al., “Single beam Fourier transform digital holographic quantitative phase microscopy,” Appl. Phys. Lett., vol. 104, no. 10, pp. 103705--, 2014.
    2. G. Baer, J. Schindler, C. Pruss, J. Siepmann, and W. Osten, “Calibration of a non-null test interferometer for the measurement of aspheres and free-form surfaces,” Opt. Express, vol. 22, no. 25, pp. 31200--31211, 2014.
    3. G. Baer, J. Schindler, C. Pruss, J. Siepmann, and W. Osten, “Fast and Flexible Non-Null Testing of Aspheres and Free-Form Surfaces with the Tilted-Wave-Interferometer,” International Journal of Optomechatronics, vol. 8, no. 4, pp. 242–250, 2014.
    4. A. Faridian, G. Pedrini, and W. Osten, “Opposed-view dark-field digital holographic microscopy,” Biomed. Opt. Express, vol. 5, no. 3, pp. 728--736, 2014.
    5. I. Fortmeier, M. Stavridis, A. Wiegmann, M. Schulz, W. Osten, and C. Elster, “Analytical Jacobian and its application to tilted-wave interferometry,” Opt. Express, vol. 22, no. 18, pp. 21313--21325, 2014.
    6. L. Fu, K. Frenner, and W. Osten, “Rigorous speckle simulation using surface integral equations and higher order boundary element method,” Opt. Lett., vol. 39, no. 14, pp. 4104--4107, 2014.
    7. Y. Fu, G. Pedrini, and X. Li, “Interferometric Dynamic Measurement: Techniques Based on High-Speed Imaging or a Single Photodetector,” The Scientific World Journal, vol. 2014, p. 14, 2014.
    8. P. Gao, G. Pedrini, C. Zuo, and W. Osten, “Phase retrieval using spatially modulated illumination,” Opt. Lett., vol. 39, no. 12, pp. 3615--3618, 2014.
    9. M. P. Georges et al., “Combined holography and thermography in a single sensor through image-plane holography at thermal infrared wavelengths,” Opt. Express, vol. 22, no. 21, pp. 25517--25529, 2014.
    10. M. Gronle, W. Lyda, M. Wilke, C. Kohler, and W. Osten, “itom: an open source metrology, automation, and data evaluation software,” Appl. Opt., vol. 53, no. 14, pp. 2974--2982, 2014.
    11. T. Haist, M. Gronle, T. Arnold, and D. A. Bui, “Verbesserung von Positionsbestimmungen mittels holografischer Mehrpunktgenerierung,” 2014.
    12. T. Haist, M. Hasler, W. Osten, and M. Baranek, “Programmable Microscopy,” 2014.
    13. T. Haist, M. Gronle, D. A. Bui, and O. W., “Holografische Mehrpunktgenerierung zur Positionsanalyse,” 2014.
    14. T. Haist, C. Lingel, R. Adler, and W. Osten, “Parallelized genetic optimization of spatial light modulator addressing for diffractive applications,” Appl. Opt., vol. 53, no. 7, pp. 1413--1418, 2014.
    15. T. Haist, S. Dong, T. Arnold, M. Gronle, and W. Osten, “Multi-image position detection,” Opt. Express, vol. 22, no. 12, pp. 14450--14463, 2014.
    16. A. M. Herkommer, “Phase space optics: an alternate approach to freeform optical systems,” 2014.
    17. A. M. Herkommer, “Advances in the design of freeform systems for imaging and illumination applications,” Journal of Optics, vol. 43, no. 4, pp. 261--268, 2014.
    18. A. Keck et al., “Multisensorisches Messsystem zur dreidimensionalen Inspektion technischer Oberflächen,” tm - Technisches Messen, vol. 81, no. 6, pp. 280--288, 2014.
    19. X. Li, G. Pedrini, and Y. Fu, “Optical Metrology under Extreme Conditions,” The Scientific World Journal, vol. 2014, p. 1, 2014.
    20. F. Mauch and W. Osten, “Model-based approach for planning and evaluation of confocal measurements of rough surfaces,” Measurement Science and Technology, vol. 25, no. 10, p. 105002, 2014.
    21. D. N. Naik, G. Pedrini, M. Takeda, and W. Osten, “Spectrally resolved incoherent holography: 3D spatial and spectral imaging using a Mach&\#x2013;Zehnder radial-shearing interferometer,” Opt. Lett., vol. 39, no. 7, pp. 1857--1860, 2014.
    22. W. Osten et al., “Recent advances in digital holography \Invited\,” Appl. Opt., vol. 53, no. 27, pp. G44--G63, 2014.
    23. W. Osten, “Remote Laboratories for Optical Metrology- from the Lab to the Cloud,” in Latin America Optics and Photonics Conference, 2014, p. LTh2D.1.
    24. S. Peterhaensel et al., “Solving the inverse grating problem with the naked eye,” Opt. Lett., vol. 39, no. 12, pp. 3547--3550, 2014.
    25. S. Peterhaensel, C. Pruss, and W. Osten, “Limits of diffractometric reconstruction of line gratings when using scalar diffraction theory,” Opt. Lett., vol. 39, no. 13, pp. 3764--3766, 2014.
    26. A. K. Singh, D. N. Naik, G. Pedrini, M. Takeda, and W. Osten, “Looking through a diffuser and around an opaque surface: A holographic approach,” Opt. Express, vol. 22, no. 7, pp. 7694--7701, 2014.
    27. A. K. Singh, A. Faridian, P. Gao, G. Pedrini, and W. Osten, “Quantitative phase imaging using a deep UV LED source,” Opt. Lett., vol. 39, no. 12, pp. 3468--3471, 2014.
    28. J. Stumpe et al., “Active and Passive LC Based Polarization Elements,” Molecular Crystals and Liquid Crystals, vol. 594, no. 1, pp. 140–149, 2014.
    29. S. Thiele, A. Seifert, and A. Herkommer, “Wave-optical design of a combined refractive-diffractive varifocal lens,” Optics Express, vol. 22, no. 11, p. 13343, 2014.
  7. 2013

    1. I. Alexeenko et al., “Nondestructive testing by using long-wave infrared interferometric techniques with CO2 lasers and microbolometer arrays,” Appl. Opt., vol. 52, no. 1, pp. A56--A67, 2013.
    2. P. Almoro, G. Pedrini, W. Osten, and C. S. Narayanamurthy, “Analysis of Bessel beam propagation in free space using digital holographic microscopy,” Optik, vol. 124, no. 14, pp. 1882--1885, 2013.
    3. G. Baer, J. Schindler, C. Pruss, and W. Osten, “Correction of misalignment introduced aberration in non-null test measurements of free-form surfaces,” Journal of the European Optical Society: Rapid Publications, vol. 8, 2013.
    4. A. Faridian, G. Pedrini, and W. Osten, “High-contrast multilayer imaging of biological organisms through dark-field digital refocusing,” 2013.
    5. D. Fleische, K. Körner, W. Lyda, M. Gronle, F. Mauch, and W. Osten, “4.3.1 Herausforderungen und Lösungsansätze für die fertigungsnahe Qualitätskontrolle mittels optischer 3D-Messtechnik,” Tagungsband. pp. 469–473, 2013.
    6. P. Gao, G. Pedrini, and W. Osten, “Phase retrieval with resolution enhancement by using structured illumination,” Opt. Lett., vol. 38, no. 24, pp. 5204--5207, 2013.
    7. P. Gao, G. Pedrini, and W. Osten, “Structured illumination for resolution enhancement and autofocusing in digital holographic microscopy,” Opt. Lett., vol. 38, no. 8, pp. 1328--1330, 2013.
    8. T. Haist et al., “Multipoint vibrometry with dynamic and static holograms,” Review of Scientific Instruments, vol. 84, no. 12, pp. 121701--, 2013.
    9. C. Joenathan, A. Bernal, G. Pedrini, and W. Osten, “Radial shear interferometer with holographic lenses coupled with a spatial Fourier transform method suitable for static and dynamic measurements,” Optical Engineering, vol. 52, pp. 5603-, Mar. 2013.
    10. A. Li et al., “Fringe projection based quantitative 3D microscopy,” Optik, vol. 124, no. 21, pp. 5052--5056, 2013.
    11. C. Lingel, T. Haist, and W. Osten, “Optimizing the diffraction efficiency of SLM-based holography with respect to the fringing field effect,” Appl. Opt., vol. 52, no. 28, pp. 6877--6883, 2013.
    12. J. Ma, C. Yuan, G. Situ, G. Pedrini, and W. Osten, “Resolution enhancement in digital holographic microscopy with structured illumination,” Chin. Opt. Lett., vol. 11, no. 9, p. 090901, 2013.
    13. F. Mauch, M. Gronle, W. Lyda, and W. Osten, “Open-source graphics processing unit–accelerated ray tracer for optical simulation,” Optical Engineering, vol. 52, no. 5, p. 053004, 2013.
    14. D. N. Naik, G. Pedrini, and W. Osten, “Recording of incoherent-object hologram as complex spatial coherence function using Sagnac radial shearing interferometer and a Pockels cell,” Opt. Express, vol. 21, no. 4, pp. 3990--3995, 2013.
    15. S. Pehnelt, P. Dollinger, W. Osten, and J. Seewig, “Topografiebeurteilung von Zylinderlaufbahnen,” MTZ - Motortechnische Zeitschrift, vol. 74, no. 4, pp. 320--325, 2013.
    16. S. Peterhaensel, C. Pruss, and W. Osten, “Phase errors in high line density CGH used for aspheric testing: beyond scalar approximation,” Opt. Express, vol. 21, no. 10, pp. 11638--11651, 2013.
    17. T. Ruppel, S. Dong, F. Rooms, W. Osten, and O. Sawodny, “Feedforward Control of Deformable Membrane Mirrors for Adaptive Optics,” IEEE Transactions on Control Systems Technology, vol. 21, no. 3, pp. 579--589, 2013.
    18. R. K. Singh, D. N. Naik, H. Itou, M. M. Brundabanam, Y. Miyamoto, and M. Takeda, “Vectorial van Cittert&\#x2013;Zernike theorem based on spatial averaging: experimental demonstrations,” Opt. Lett., vol. 38, no. 22, pp. 4809--4812, 2013.
    19. M. Takeda, “Spatial stationarity of statistical optical fields for coherence holography and photon correlation holography,” Opt. Lett., vol. 38, no. 17, pp. 3452--3455, 2013.
    20. H. J. Tiziani and G. Pedrini, “From speckle pattern photography to digital holographic interferometry \Invited\,” Appl. Opt., vol. 52, no. 1, pp. 30--44, 2013.
    21. J.-F. Vandenrijt et al., “Mobile speckle interferometer in the long-wave infrared for aeronautical nondestructive testing in field conditions,” Optical Engineering, vol. 52, no. 10, p. 101903, 2013.
    22. Y. Zhang, G. Situ, G. Pedrini, D. Wang, B. Javidi, and W. Osten, “Application of short-coherence lensless Fourier-transform digital holography in imaging through diffusive medium,” Optics Communications, vol. 286, pp. 56–59, Jan. 2013.
  8. 2012

    1. P. F. Almoro et al., “Enhanced deterministic phase retrieval using a partially developed speckle field,” Opt. Lett., vol. 37, no. 11, pp. 2088--2090, 2012.
    2. P. Bao, G. Situ, G. Pedrini, and W. Osten, “Lensless phase microscopy using phase retrieval with multiple illumination wavelengths,” Appl. Opt., vol. 51, no. 22, pp. 5486--5494, 2012.
    3. P. Bao, G. Pedrini, and W. Osten, “Optical surface profile measurement using phase retrieval by tuning the illumination wavelength,” Optics Communications, vol. 285, pp. 5029–5036, Nov. 2012.
    4. A. Burla, T. Haist, W. Lyda, and W. Osten, “Genetic Programming Applied to Automatic Algorithm Design in Multi-scale Inspection Systems,” Optical Engineering, vol. 51, pp. 7001-, Jun. 2012.
    5. S. Dolev, T. Haist, and M. Oltean, “Optical supercomputing: introduction to special issue.,” The Journal of Supercomputing, vol. 62, pp. 617–619, Nov. 2012.
    6. S. Dong, T. Haist, W. Osten, T. Ruppel, and O. Sawodny, “Response analysis of holography-based modal wavefront sensor,” Applied Optics, vol. 51, no. 9, pp. 1318--1327, 2012.
    7. S. Dong, T. Haist, and W. Osten, “Hybrid wavefront sensor for the fast detection of wavefront disturbances,” Appl. Opt., vol. 51, no. 25, pp. 6268--6274, 2012.
    8. V. Ferreras Paz et al., “Development of functional sub-100 nm structures with 3D two-photon polymerization technique and optical methods for characterization,” Journal of Laser Applications, vol. 24, Jul. 2012.
    9. V. Ferreras Paz, S. Peterhänsel, K. Frenner, and W. Osten, “Solving the inverse grating problem by white light interference Fourier scatterometry,” Light: Science & Applications, vol. 1, Nov. 2012.
    10. T. Haist and W. Osten, “White-light interferometric method for secure key distribution.,” The Journal of Supercomputing, vol. 62, no. 2, pp. 656–662, 2012.
    11. M. Hasler, T. Haist, and W. Osten, “Stereo vision in spatial-light-modulator--based microscopy,” Opt. Lett., vol. 37, no. 12, pp. 2238--2240, 2012.
    12. C. Joenathan, G. Pedrini, I. Alekseenko, and W. Osten, “Novel and simple lateral shear interferometer with holographic lens and spatial Fourier Transform,” Optical Engineering, vol. 51, pp. 5601-, Jul. 2012.
    13. K. Körner, G. Pedrini, I. Alexeenko, T. Steinmetz, R. Holzwarth, and W. Osten, “Short temporal coherence digital holography with a femtosecond frequency comb laser for multi-level optical sectioning,” Opt. Express, vol. 20, no. 7, pp. 7237--7242, 2012.
    14. W. Lyda, A. Burla, T. Haist, M. Gronle, and W. Osten, “Implementation and Analysis of an Automated Multiscale Measurement Strategy for Wafer Scale Inspection of Micro Electromechanical Systems,” International Journal of Precision Engineering and Manufacturing, vol. 13, Apr. 2012.
    15. W. Lyda, M. Gronle, D. Fleischle, F. Mauch, and W. Osten, “Advantages of chromatic-confocal spectral interferometry in comparison to chromatic confocal microscopy,” Measurement Science & Technology - MEAS SCI TECHNOL, vol. 23, May 2012.
    16. F. Mauch, W. Lyda, M. Gronle, and W. Osten, “Improved signal model for confocal sensors accounting for object depending artifacts,” Opt. Express, vol. 20, no. 18, pp. 19936--19945, 2012.
    17. W. Osten, “Different Ways to Overcome the Resolution Problem in Optical Micro and Nano Metrology,” Optical Imaging and Metrology: Advanced Technologies, pp. 327–368, Aug. 2012.
    18. W. Osten and N. Reingand, Optical Imaging and Metrology: Advanced Technologies, vol. Wiley‐VCH Verlag & Co. KGaA. 2012.
    19. G. Pedrini, H. Li, A. Faridian, and W. Osten, “Digital holography of self-luminous objects by using a Mach--Zehnder setup,” Opt. Lett., vol. 37, no. 4, pp. 713--715, 2012.
    20. T. Pinto, C. Kohler, and A. Albertazzi, “Regular mesh measurement of large free form surfaces using stereo vision and fringe projection,” Optics and Lasers in Engineering, vol. 50, pp. 910–916, Jul. 2012.
    21. D. Rausch and A. M. Herkommer, “Phase space approach to the use of integrator rods and optical arrays in illumination systems,” Advanced Optical Technologies, vol. 1, pp. 69–78, Mar. 2012.
    22. R. Reichle, C. Pruss, C. Gessenhardt, C. Schulz, and W. Osten, “Diffractive/refractive (hybrid) UV-imaging system for minimally invasive metrology: design, performance, and application experiments,” Appl. Opt., vol. 51, no. 12, pp. 1982--1996, 2012.
    23. M. Rumpel et al., “Circular grating waveguide structures for intracavity generation of azimuthal polarization in a thin-disk laser,” Opt. Lett., vol. 37, no. 10, pp. 1763--1765, 2012.
    24. P. Schau et al., “Polarization scramblers with plasmonic meander-type metamaterials,” Optics Express, vol. 20, no. 20, pp. 22700–22711, 2012.
    25. H. Schweizer et al., “Resonant multimeander-metasurfaces: A model system for superlenses and communication devices,” physica status solidi (b), vol. 249, Jul. 2012.
    26. M. M. Vogel et al., “Single-layer resonant-waveguide grating for polarization and wavelength selection in Yb:YAG thin-disk lasers,” Opt. Express, vol. 20, no. 4, pp. 4024--4031, 2012.
    27. M. Warber, T. Haist, M. Hasler, and W. Osten, “Vertical differential interference contrast,” Optical Engineering, vol. 51, no. 1, p. 013204, 2012.
    28. J. Zimmermann, O. Sawodny, W. Lyda, and W. Osten, “A Control System for Automated Multiscale Measuring systems,” Mechatronics, vol. 22, no. 3, pp. 338--348, 2012.
  9. 2011

    1. M. A. Ahmed et al., “High-power radially polarized Yb:YAG thin-disk laser with high efficiency,” Opt. Express, vol. 19, no. 6, pp. 5093--5103, 2011.
    2. P. Almoro, G. Pedrini, P. Gundu, W. Osten, and S. Hanson, “Enhanced wavefront reconstruction by random phase modulation with a phase diffuser,” Optics and Lasers in Engineering, vol. 49, pp. 252–257, Feb. 2011.
    3. A. Anand, A. Faridian, V. Chhaniwal, G. Pedrini, W. Osten, and B. Javidi, “High-resolution quantitative phase microscopic imaging in deep UV with phase retrieval,” Opt. Lett., vol. 36, no. 22, pp. 4362--4364, 2011.
    4. R. Berger et al., “Interferometrische Messung von Freiform-Schneidkanten auf einer Diamantwerkzeugbearbeitungsmaschine,” tm - Technisches Messen, vol. 78, pp. 439–446, Oct. 2011.
    5. B. Bilski, K. Frenner, and W. Osten, “About the influence of Line Edge Roughness on measured effective--CD,” Opt. Express, vol. 19, no. 21, pp. 19967--19972, 2011.
    6. A. Burla, T. Haist, W. Lyda, and W. Osten, “Fourier descriptors for defect indication in a multiscale and multisensor measurement system,” Optical Engineering - OPT ENG, vol. 50, Apr. 2011.
    7. L. Fu et al., “Mode coupling and interaction in a plasmonic microcavity with resonant  mirrors,” vol. 84, no. 23, pp. 235402; 1–6, 2011.
    8. M. Gronle, W. Lyda, F. Mauch, and W. Osten, “Laterally chromatically dispersed, spectrally encoded interferometer,” Appl. Opt., vol. 50, no. 23, pp. 4574--4580, 2011.
    9. M. Haefner, C. Pruß, and W. Osten, “laser direct writing,” Optik & Photonik, vol. 6, no. 4, pp. 40–43, 2011.
    10. M. Haefner, C. Pruss, and W. Osten, “Laser direct writing of rotationally symmetric high-resolution structures,” Appl. Opt., vol. 50, no. 31, pp. 5983--5989, 2011.
    11. D. Hopp et al., “Diffractive incremental and absolute coding principle for optical rotary                sensors,” Appl. Opt., vol. 50, no. 26, pp. 5169--5177, 2011.
    12. J. Ma, C. Pruss, R. Zhu, Z. Gao, C. Yuan, and W. Osten, “An absolute test for axicon surfaces,” Opt. Lett., vol. 36, no. 11, pp. 2005--2007, 2011.
    13. J. Ma et al., “Systematic analysis of the measurement of cone angles using high line density computer-generated holograms,” Optical Engineering - OPT ENG, vol. 50, May 2011.
    14. W. Osten, “What Optical Metrology Can Do for Experimental Mechanics?,” in Advances in Experimental Mechanics VIII, 2011, vol. 70, pp. 1--20.
    15. G. Pedrini, M. E. Schmidt, I. Alekseenko, O. Paul, and W. Osten, “Measurement of nano/micro out-of-plane and in-plane displacements of micromechanical components by using digital holography and speckle interferometry,” Optical Engineering - OPT ENG, vol. 50, Oct. 2011.
    16. G. Pedrini, F. Zhang, and W. Osten, “Phase retrieval by pinhole scanning,” Opt. Lett., vol. 36, no. 7, pp. 1113--1115, 2011.
    17. S. Pehnelt, W. Osten, and J. Seewig, “Vergleichende Untersuchung optischer Oberflächenmessgeräte mit einem Chirp-Kalibriernormal,” tm - Technisches Messen, vol. 78, pp. 457–462, Oct. 2011.
    18. T. Ruppel, W. Osten, and O. Sawodny, “Model-based feedforward control of large deformable mirrors,” Eur. J. Control, vol. 17, no. 3, pp. 261–272, 2011.
    19. P. Schau, K. Frenner, L. Fu, H. Schweizer, H. Gießen, and W. Osten, “Design of high-transmission metallic meander stacks with different grating periodicities for subwavelength-imaging applications,” Optics Express, vol. 19, no. 4, pp. 3627–3636, 2011.
    20. C. Yuan, G. Situ, G. Pedrini, J. Ma, and W. Osten, “Resolution improvement in digital holography by angular and polarization multiplexing,” Appl. Opt., vol. 50, no. 7, pp. B6--B11, 2011.
  10. 2010

    1. P. Almoro et al., “Fault-Tolerant Characterization of Phase Objects Using a Speckle-Based Phase Retrieval Technique,” International Journal of Optomechatronics, vol. 4, pp. 397–410, Oct. 2010.
    2. P. F. Almoro, G. Pedrini, P. N. Gundu, W. Osten, and S. G. Hanson, “Phase microscopy of technical and biological samples through random phase modulation with a diffuser,” Opt. Lett., vol. 35, no. 7, pp. 1028--1030, 2010.
    3. G. Baer, E. Garbusi, W. Lyda, and W. Osten, “Automated surface positioning for a non-null test interferometer,” Optical Engineering, vol. 49, pp. 5602-, Sep. 2010.
    4. A. Burla et al., “Reliability Analysis of Indicator Functions in an Automated Multiscale Measuring System,” 2010.
    5. M. DaneshPanah, S. Zwick, F. Schaal, M. Warber, B. Javidi, and W. Osten, “3D Holographic Imaging and Trapping for Non-Invasive Cell Identification and Tracking,” J. Display Technol., vol. 6, no. 10, pp. 490--499, 2010.
    6. A. Faridian, D. Hopp, G. Pedrini, U. Eigenthaler, M. Hirscher, and W. Osten, “Nanoscale imaging using deep ultraviolet digital holographic microscopy,” Opt. Express, vol. 18, no. 13, pp. 14159--14164, 2010.
    7. D. Fleischle, W. Lyda, F. Mauch, and W. Osten, “Optical metrology for process control: modeling and simulation of sensors for a comparison of different measurement principles,” in Optical Micro- and Nanometrology III, 2010.
    8. U. Gopinathan, G. Pedrini, B. Javidi, and W. Osten, “Lensless 3D Digital Holographic Microscopic Imaging at Vacuum UV Wavelength,” Display Technology, Journal of, vol. 6, pp. 479–483, Nov. 2010.
    9. D. Hopp, C. Pruss, W. Osten, J. Seybold, V. Mayer, and H. Kück, “Optischer inkrementaler Drehgeber in Low-Cost-Bauweise,” tm - Technisches Messen, vol. 77, Jun. 2010.
    10. W. Osten, B. Doerband, E. Garbusi, Ch. Pruss, and L. Seifert, “Testing aspheric lenses: New approaches,” Optoelectronics, Instrumentation and Data Processing, vol. 46, no. 4, pp. 329--339, 2010.
    11. G. Situ, M. Warber, G. Pedrini, and W. Osten, “Phase contrast enhancement in microscopy using spiral phase filtering,” Optics Communications, vol. 287, pp. 1273–1277, Apr. 2010.
    12. G. Situ, G. Pedrini, and W. Osten, “Strategy for cryptanalysis of optical encryption in the Fresnel domain,” Appl. Opt., vol. 49, no. 3, pp. 457--462, 2010.
    13. M. Warber, S. Maier, T. Haist, and W. Osten, “Combination of scene-based and stochastic measurement for wide-field aberration correction in microscopic imaging,” Appl. Opt., vol. 49, no. 28, pp. 5474--5479, 2010.
    14. S. Zwick, C. Schaub, T. Haist, and W. Osten, “Light fields with an axially expanded intensity distribution for stable three-dimensional optical trapping,” Opt. Express, vol. 18, no. 19, pp. 19941--19950, 2010.
    15. S. Zwick, T. Haist, M. Warber, and W. Osten, “Dynamic holography using pixelated light modulators,” Appl. Opt., vol. 49, no. 25, pp. F47--F58, 2010.
  11. 2009

    1. P. F. Almoro, G. Pedrini, A. Anand, W. Osten, and S. G. Hanson, “Angular displacement and deformation analyses using a speckle-based wavefront sensor,” Appl. Opt., vol. 48, no. 5, pp. 932--940, 2009.
    2. A. Anand, V. K. Chhaniwal, P. Almoro, G. Pedrini, and W. Osten, “Shape and deformation measurements of 3D objects using volume speckle field and phase retrieval,” Opt. Lett., vol. 34, no. 10, pp. 1522--1524, 2009.
    3. K. Christian, S. Xavier, O. Wolfgang, and B. Torsten, “Charakterisierung von Flüssigkristalllichtmodulatoren für die Rekonstruktion digitaler Hologramme (Investigation and Qualification of Spatial Light Modulators for the Reconstruction of Digital Holograms),” tm - Technisches Messen, vol. 73. pp. 157--, 2009.
    4. E. F., O. Wolfgang, and J. Werner, “Detektion und Analyse von Materialfehlern nach dem Prinzip „Erkennung durch Synthese” (Detection and Analysis of Material Faults using the Principle ‘Recognition by Synthesis’),” tm – Technisches Messen Plattform für Methoden, Systeme und Anwendungen der Messtechnik, vol. 69. pp. 227--, 2009.
    5. Y. Fu, G. Pedrini, B. Hennelly, R. Groves, and W. Osten, “Dual-wavelength image-plane digital holography for dynamic measurement,” Optics and Lasers in Engineering, vol. 47, pp. 552–557, May 2009.
    6. E. Garbusi, C. Pruss, and W. Osten, “Process-Integrated Measurement of Aspherical Surfaces Prozessintegrierte Vermessung asphärischer Oberflächen,” Tm-technisches Messen, vol. 76, pp. 354–359, Jul. 2009.
    7. E. Garbusi and W. Osten, “Perturbation methods in optics: application to the interferometric measurement of surfaces,” J. Opt. Soc. Am. A, vol. 26, no. 12, pp. 2538--2549, 2009.
    8. R. Groves, B. Pradarutti, E. Kouloumpi, W. Osten, and G. Notni, “2D and 3D non-destructive evaluation of a wooden panel painting using shearography and terahertz imaging,” NDT & E International, vol. 42, pp. 543–549, Sep. 2009.
    9. T. Haist and W. Osten, “Proposal for Secure Key Distribution Using Classical Optics.,” in OSC, 2009, vol. 5882, pp. 99–101.
    10. M. Hering, K. Koerner, and B. Jaehne, “Correlated speckle noise in white-light interferometry: theoretical analysis of measurement uncertainty,” Appl. Opt., vol. 48, no. 3, pp. 525--538, 2009.
    11. C. Kohler, F. Zhang, and W. Osten, “Characterization of a spatial light modulator and its application in phase retrieval,” Appl. Opt., vol. 48, no. 20, pp. 4003--4008, 2009.
    12. C. Kohler, T. Haist, and W. Osten, “Model-free method for measuring the full Jones matrix of reflective liquid-crystal displays,” 2009.
    13. K. M., O. Wolfgang, and J. Werner, “Scherografie – die Umsetzung des Prinzips in ein mobiles Prüfsystem (Shearography – the Implementation of the Principle into a Mobile Inspection System),” tm – Technisches Messen Plattform für Methoden, Systeme und Anwendungen der Messtechnik, vol. 69. pp. 217--, 2009.
    14. G. Pedrini, J. Gaspar, O. Paul, and W. Osten, “Measurement of in-plane deformations of microsystems by digital holography and speckle interferometry,” Chinese Optics Letters, vol. 7, pp. 1109–1112, Dec. 2009.
    15. G. Pedrini, J. Gaspar, W. Osten, and O. Paul, “Development of Reference Standards for the Calibration of Optical Systems Used in the Measurement of Microcomponents,” Strain, vol. 46, pp. 79–88, Jan. 2009.
    16. G. Pedrini, J. Gaspar, T. Wu, W. Osten, and O. Paul, “Calibration of optical systems for the measurement of microcomponents,” Optics and Lasers in Engineering, vol. 47, pp. 203–210, Feb. 2009.
    17. S. Rafler, M. Petschow, U. Seifert, K. Frenner, J. Gockeritz, and W. Osten, “Effects of pupil discretization and Littrow illumination in the simulation of bright-field defect detection,” Opt. Lett., vol. 34, no. 12, pp. 1840--1842, 2009.
    18. F. Schaal, M. Warber, S. Zwick, H. van der Kuip, T. Haist, and W. Osten, “Marker-free cell discrimination by holographic optical tweezers,” Journal of The European Optical Society-rapid Publications - J EUR OPT SOC-RAPID PUBL, vol. 4, Jun. 2009.
    19. T. Schuster, S. Rafler, V. F. Paz, K. Frenner, and W. Osten, “Fieldstitching with Kirchhoff-boundaries as a model based description for line edge roughness (LER) in scatterometry,” Microelectronic Engineering, vol. 86, no. 4–6, pp. 1029--1032, 2009.
    20. G. Situ, G. Pedrini, and W. Osten, “Spiral phase filtering and orientation-selective edge detection/enhancement,” J. Opt. Soc. Am. A, vol. 26, no. 8, pp. 1788--1797, 2009.
    21. S. Zwick et al., “Holographic twin traps,” Journal of Optics A: Pure and Applied Optics, vol. 11, p. 034011, Jan. 2009.
  12. 2008

    1. P. F. Almoro, G. Pedrini, A. Anand, W. Osten, and S. G. Hanson, “Interferometric evaluation of angular displacements using phase retrieval,” Opt. Lett., vol. 33, no. 18, pp. 2041--2043, 2008.
    2. N. Anscombe and W. Osten, “Measuring up to industry,” Nature Photonics, vol. 2, p. 672, 2008.
    3. P. Bao, F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval using multiple illumination wavelengths,” Opt. Lett., vol. 33, no. 4, pp. 309--311, 2008.
    4. E. Garbusi, C. Pruss, and W. Osten, “Single frame interferogram evaluation,” Appl. Opt., vol. 47, no. 12, pp. 2046--2052, 2008.
    5. P. Goetz, T. Schuster, K. Frenner, S. Rafler, and W. Osten, “Normal vector method for the RCWA with automated vector field generation,” Opt. Express, vol. 16, no. 22, pp. 17295--17301, 2008.
    6. U. Gopinathan, G. Pedrini, and W. Osten, “Coherence effects in digital in-line holographic microscopy,” J. Opt. Soc. Am. A, vol. 25, no. 10, pp. 2459--2466, 2008.
    7. R. M. Groves, G. Pedrini, and W. Osten, “Real-time extended dynamic range imaging in shearography,” Appl. Opt., vol. 47, no. 30, pp. 5550--5556, 2008.
    8. T. Haist and W. Osten, “Ultrafast Digital-Optical Arithmetic Using Wave-Optical Computing,” 2008, pp. 33–45.
    9. C. Kohler, T. Haist, X. Schwab, and W. Osten, “Hologram optimization for SLM-based reconstruction with regard to polarization effects,” Opt. Express, vol. 16, no. 19, pp. 14853--14861, 2008.
    10. W. Osten, “Digital Image Processing for Optical Metrology,” pp. 481–563, 2008.
    11. J. Regin et al., “Fusion multimodaler Daten am Beispiel eines Mikrolinsen-Arrays,” tm - Technisches Messen, vol. 75, no. 5, pp. 346--359, 2008.
    12. G. Situ, D. S. Monaghan, T. J. Naughton, J. T. Sheridan, G. Pedrini, and W. Osten, “Collision in double random phase encoding,” Optics Communications, vol. 281, no. 20, pp. 5122--5125, 2008.
    13. Q. Tan, G. Pedrini, and W. Osten, “Phase retrieval of complex optical fields by binary amplitude modulation,” Appl. Opt., vol. 47, no. 22, pp. 4077--4084, 2008.
    14. D. Wang, J. Zhao, F. Zhang, G. Pedrini, and W. Osten, “High-fidelity numerical realization of multiple-step Fresnel propagation for the reconstruction of digital holograms,” Appl. Opt., vol. 47, no. 19, pp. D12--D20, 2008.
  13. 2007

    1. P. Almoro, G. Pedrini, and W. Osten, “Aperture synthesis in phase retrieval using a volume-speckle field,” Opt. Lett., vol. 32, no. 7, pp. 733--735, 2007.
    2. A. Anand, G. Pedrini, W. Osten, and P. Almoro, “Wavefront sensing with random amplitude mask and phase retrieval,” Opt. Lett., vol. 32, no. 11, pp. 1584--1586, 2007.
    3. Y. Fu, G. Pedrini, and W. Osten, “Vibration measurement by temporal Fourier analyses of a digital hologram sequence,” Appl. Opt., vol. 46, no. 23, pp. 5719--5727, 2007.
    4. Y. Fu, R. M. Groves, G. Pedrini, and W. Osten, “Kinematic and deformation parameter measurement by spatiotemporal analysis of an interferogram sequence,” Appl. Opt., vol. 46, no. 36, pp. 8645--8655, 2007.
    5. W. Gorski and W. Osten, “Tomographic imaging of photonic crystal fibers,” Opt. Lett., vol. 32, no. 14, pp. 1977--1979, 2007.
    6. T. Haist and W. Osten, “An Optical Solution For The Traveling Salesman Problem,” Opt. Express, vol. 15, no. 16, pp. 10473--10482, 2007.
    7. N. Kerwien, T. Schuster, S. Rafler, W. Osten, and M. Totzeck, “Vectorial thin-element approximation: a semirigorous determination of Kirchhoff’s boundary conditions,” J. Opt. Soc. Am. A, vol. 24, no. 4, pp. 1074--1084, 2007.
    8. E. Kolenović and W. Osten, “Estimation of the phase error in interferometric measurements by evaluation of the speckle field intensity,” Appl. Opt., vol. 46, no. 24, pp. 6096--6104, 2007.
    9. G. Pedrini, F. Zhang, and W. Osten, “Digital holographic microscopy in the deep (193 nm) ultraviolet,” Appl. Opt., vol. 46, no. 32, pp. 7829--7835, 2007.
    10. G. Pedrini and W. Osten, “Time Resolved Digital Holographic Interferometry for Investigations of Dynamical Events in Mechanical Components and Biological Tissues,” Strain, vol. 43, pp. 240–249, Aug. 2007.
    11. G. Pedrini, F. Zhang, and W. Osten, “Deterministic phase retrieval from diffracted intensities speckle fields,” Optics Communications, vol. 277, no. 1, pp. 50--56, 2007.
    12. L. Yu, G. Pedrini, W. Osten, and M. K. Kim, “Three-dimensional angle measurement based on propagation vector analysis of digital holography,” Appl. Opt., vol. 46, no. 17, pp. 3539--3545, 2007.
    13. F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval of arbitrary complex-valued fields through aperture-plane modulation,” Phys. Rev. A, vol. 75, Apr. 2007.
  14. 2006

    1. T. S. A., F. M. Santoyo, M. D. la Torre Ibarra, G. Pedrini, and W. Osten, “Simultaneous two-dimensional endoscopic pulsed digital holography for evaluation of dynamic displacements,” Appl. Opt., vol. 45, no. 19, pp. 4534--4539, 2006.
    2. P. Almoro, G. Pedrini, and W. Osten, “Complete wavefront reconstruction using sequential intensity measurements of a volume speckle field,” Appl. Opt., vol. 45, no. 34, pp. 8596--8605, 2006.
    3. T. Baumbach, W. Osten, C. von Kopylow, and W. Jueptner, “Remote metrology by comparative digital holography,” Appl. Opt., vol. 45, no. 5, pp. 925--934, 2006.
    4. T. Baumbach, C. von Kopylow, W. Jüptner, and W. Osten, “Formvergleich zweier Objekte an unterschiedlichen Standorten mit digitaler Holografie (Shape Comparison between two Objects at Different Locations with Digital Holography),” Tm-technisches Messen, vol. 73, pp. 120–131, Jan. 2006.
    5. T. Haist, M. Reicherter, M. Wu, and L. Seifert, “Using Graphics Boards to Compute Holograms.,” Computing in Science and Engineering, vol. 8, no. 1, pp. 8–13, 2006.
    6. T. Haist, S. Zwick, M. Warber, and W. Osten, “Spatial Light Modulators—Versatile Tools for Holography,” Journal of Holography and Speckle, vol. 3, pp. 125–136, Dec. 2006.
    7. J. Kauffmann and H. J. Tiziani, “Time-resolved vibration measurement with temporal speckle pattern interferometry,” Appl. Opt., vol. 45, no. 26, pp. 6682--6688, 2006.
    8. C. Kohler, U. Droste, K. Körner, and W. Osten, “Reduktion von Überschwingern bei der 3D-Streifenprojektion durch „Inverse Filterung“ (Reduction of Overshooting in 3D Fringe Projection Measurements by Inverse Filtering),” Tm-technisches Messen, vol. 73, pp. 595–602, Nov. 2006.
    9. C. Kohler, X. Schwab, and W. Osten, “Optimally tuned spatial light modulators for digital holography,” Appl. Opt., vol. 45, no. 5, pp. 960--967, 2006.
    10. K. Körner, A. K. Ruprecht, T. Wiesendanger, and W. Osten, “Optical profiling techniques for MEMS Measurement,” pp. 145–162, 2006.
    11. W. Osten and P. Ferraro, “Digital Holography for the Inspection of Microsystems,” pp. 351–426, 2006.
    12. W. Osten and W. Jüptner, “Messtechnik im Zeitalter der Globalisierung: Objektvergleich über große Entfernungen mit interferometrischer Empfindlichkeit,” Tm-technisches Messen, vol. 73, pp. 117–119, Jan. 2006.
    13. E. Papastathopoulos, K. Koerner, and W. Osten, “Chromatically dispersed interferometry with wavelet analysis,” Opt. Lett., vol. 31, no. 5, pp. 589--591, 2006.
    14. E. Papastathopoulos, K. Koerner, and W. Osten, “Chromatic confocal spectral interferometry,” Appl. Opt., vol. 45, no. 32, pp. 8244--8252, 2006.
    15. G. Pauliat, G. Roosen, M. Georges, and G. Pedrini, “Passive introduction of carrier fringes in real-time photorefractive interferometers for single interferogram analysis,” Journal of The European Optical Society-rapid Publications - J EUR OPT SOC-RAPID PUBL, vol. 1, Nov. 2006.
    16. G. Pedrini, W. Osten, and M. E. Gusev, “High-speed digital holographic interferometry for vibration measurement,” Appl. Opt., vol. 45, no. 15, pp. 3456--3462, 2006.
    17. G. Pedrini, I. Alexeenko, W. Osten, and U. Schnars, “On-line surveillance of a dynamic process by a moving system based on pulsed digital holographic interferometry,” Appl. Opt., vol. 45, no. 5, pp. 935--943, 2006.
    18. M. Reicherter, S. Zwick, T. Haist, C. Kohler, H. Tiziani, and W. Osten, “Fast digital hologram generation and adaptive force measurement in liquid-crystal-display-based holographic tweezers,” Appl. Opt., vol. 45, no. 5, pp. 888--896, 2006.
    19. A. T. Saucedo, F. M. Santoyo, M. D. la Torre-Ibarra, G. Pedrini, and W. Osten, “Endoscopic pulsed digital holography for 3D measurements,” Opt. Express, vol. 14, no. 4, pp. 1468--1475, 2006.
    20. F. Zhang, G. Pedrini, and W. Osten, “Reply to Comment on ‘Reconstruction algorithm for high-numerical-aperture holograms with diffraction-limited resolution,’” Opt. Lett., vol. 31, no. 19, pp. 2848--2848, 2006.
    21. F. Zhang, G. Pedrini, and W. Osten, “Reconstruction algorithm for high-numerical-aperture holograms with diffraction-limited resolution,” Opt. Lett., vol. 31, no. 11, pp. 1633--1635, 2006.
  15. 2005

    1. R. Berger, N. Kerwien, and W. Osten, “The Chirp-Z-Transform in Digital Holography,” Journal of Holography and Speckle, vol. 2, no. 1, pp. 1--4, 2005.
    2. C. v. Kopylow, T. Baumbach, W. Osten, and W. Jüptner, “Comparative Digital Holography for application in Quality Assurance during Production,” vol. 12, pp. 137–142, 2005.
    3. L. Martinez-Leon, G. Pedrini, and W. Osten, “Applications of short-coherence digital holography in microscopy,” Appl. Opt., vol. 44, no. 19, pp. 3977--3984, 2005.
    4. W. Osten, “Digital Holography,” pp. 79–88, 2005.
    5. W. Osten, C. S. Kohler, and J. Liesener, “Evaluation and application of spatial light modulators for optical metrology,” 2005.
    6. G. Pedrini, W. Osten, and Y. Zhang, “Wave-front reconstruction from a sequence of interferograms recorded at different planes,” Opt. Lett., vol. 30, no. 8, pp. 833--835, 2005.
    7. G. Pedrini, I. Alexeenko, P. Zaslansky, H. J. Tiziani, and W. Osten, “Digital holographic interferometry for investigations in biomechanics,” Proceedings of SPIE - The International Society for Optical Engineering, vol. 5776, Feb. 2005.
    8. L. Seifert, H. J. Tiziani, and W. Osten, “Wavefront reconstruction with the adaptive Shack–Hartmann sensor,” Optics Communications, vol. 245, pp. 255–269, Jan. 2005.
    9. A. Tavrov, J. Schmit, N. Kerwien, W. Osten, and H. Tiziani, “Diffraction-induced coherence levels,” Appl. Opt., vol. 44, no. 11, pp. 2202--2212, 2005.
    10. Y. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, “Reconstruction of In-Line Holograms Using Phase Retrieval Algorithms,” Physica Scripta, p. 102, 2005.
    11. D.-X. Zheng, Y. Zhang, J.-L. Shen, C.-L. Zhang, and G. Pedrini, “Wave field reconstruction from a hologram sequence,” Optics Communications, vol. 249, no. 1–3, pp. 73--77, 2005.
  16. 2004

    1. D. Kayser, T. Bothe, and W. Osten, “Scaled topometry in a multisensor approach,” Optical Engineering - OPT ENG, vol. 43, pp. 2469–2477, Oct. 2004.
    2. K. Körner, A. Ruprecht, and T. Wiesendanger, “New approaches in depth-scanning optical metrology,” Proceedings of SPIE - The International Society for Optical Engineering, vol. 5457, Sep. 2004.
    3. W. Li, T. Bothe, W. Osten, and M. Kalms, “Object adapted pattern projection—Part I: generation of inverse patterns,” Optics and Lasers in Engineering, vol. 41, no. 1, pp. 31–50, 2004.
    4. C. Pruss, S. Reichelt, H. Tiziani, and W. Osten, “Computer-generated holograms in interferometric testing,” Optical Engineering - OPT ENG, vol. 43, pp. 2534–2540, Nov. 2004.
    5. C. Pruss and H. J. Tiziani, “Dynamic null lens for aspheric testing using a membrane mirror,” Optics Communications - OPT COMMUN, vol. 233, pp. 15–19, Mar. 2004.
    6. A. K. Ruprecht, T. F. Wiesendanger, and H. J. Tiziani, “Chromatic confocal microscopy with a finite pinhole size,” Opt. Lett., vol. 29, no. 18, pp. 2130--2132, 2004.
    7. Y. Yasuno, T. F Wiesendanger, A. K Ruprecht, S. Makita, T. Yatagai, and H. J Tiziani, “Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope,” Optics Communications, vol. 232, pp. 91–97, Mar. 2004.
    8. Y. a. n. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, “Phase retrieval microscopy for quantitative phase-contrast imaging,” Optik, vol. 115, no. 2, pp. 94–96, 2004.
    9. Y. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, “Applications of fractional transforms to object reconstruction from in-line holograms,” Opt. Lett., vol. 29, no. 15, pp. 1793--1795, 2004.
    10. Y. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, “Reconstruction of in-line digital holograms from two intensity measurements,” Opt. Lett., vol. 29, no. 15, pp. 1787--1789, 2004.
  17. 2003

    1. C. Falldorf, W. Osten, and E. Kolenovic, “Speckle shearography using a multiband light source,” Optics and Lasers in Engineering, vol. 40, pp. 543–552, Nov. 2003.
    2. T. Haist, W. Osten, M. Reicherter, J. Liesener, and L. Seifert, “Dynamic holography and its application in measurement systems,” Proceedings of SPIE - The International Society for Optical Engineering, vol. 5202, Nov. 2003.
    3. M. Kalms and W. Osten, “Mobile shearography system for the inspection of aircraft and automotive components,” Optical Engineering - OPT ENG, vol. 42, pp. 1188–1196, May 2003.
    4. E. Kolenovic, W. Osten, R. Klattenhoff, S. Lai, C. von Kopylow, and W. Jüptner, “Miniaturized digital holography sensor for distal three-dimensional endoscopy,” Appl. Opt., vol. 42, no. 25, pp. 5167--5172, 2003.
    5. K. Leonhardt, U. Droste, and H. J. Tiziani, “Interferometry for Ellipso-Height-Topometry – Part 1: Coherence scanning on the base of spacial coherence,” Optik - International Journal for Light and Electron Optics, vol. 113, pp. 513–519, Dec. 2003.
    6. G. Pedrini, I. Alexeenko, W. Osten, and H. J. Tiziani, “Temporal phase unwrapping of digital hologram sequences,” Appl. Opt., vol. 42, no. 29, pp. 5846--5854, 2003.
    7. G. Pedrini, M. Gusev, S. Schedin, and H. J. Tiziani, “Pulsed digital holographic interferometry by using a flexible fiber endoscope,” Optics and Lasers in Engineering - OPT LASER ENG, vol. 40, pp. 487–499, Nov. 2003.
    8. K.-P. Proll, J.-M. Nivet, K. Körner, and H. J. Tiziani, “Microscopic three-dimensional topometry with ferroelectric liquid-crystal-on-silicon displays,” Appl. Opt., vol. 42, no. 10, pp. 1773--1778, 2003.
    9. S. Reichelt and H. J. Tiziani, “Twin-CGHs for absolute calibration in wavefront testing interferometry,” Bg, vol. 878740, May 2003.
    10. S. Reichelt, C. Pruss, and H. J. Tiziani, “Absolute interferometric test of aspheres by use of twin computer-generated holograms,” Appl. Opt., vol. 42, no. 22, pp. 4468--4479, 2003.
    11. L. Seifert, J. Liesener, and H. J. Tiziani, “The adaptive Shack–Hartmann sensor,” Optics Communications, vol. 216, no. 4, pp. 313–319, 2003.
    12. T. Wiesendanger, Y. Yasuno, A. Ruprecht, T. Yatagai, and H. Tiziani, “Characterization of Microoptic Arrays by Evaluation of the Axial Confocal Response,” Optical Review, vol. 10, pp. 301–302, Jul. 2003.
    13. Y. Yasuno, T. Yatagai, T. Wiesendanger, A. Ruprecht, and H. Tiziani, “Aberration measurement from confocal axial intensity response using neural network,” Optics express, vol. 10, pp. 1451–7, Jan. 2003.
    14. Y. Yasuno, T. Wiesendanger, A. Ruprecht, T. Yatagai, and H. J. Tiziani, “Determination of Aberration Coefficient of Microoptic Arrays from Axial Confocal Response by Neural Method,” Optical Review, vol. 10, pp. 318–320, Jul. 2003.
    15. Y. Yasuno, S. Makita, T. Yatagai, T. F. Wiesendanger, A. K. Ruprecht, and H. J. Tiziani, “Non-mechanically-axial-scanning confocal microscope using adaptive mirror switching,” Opt. Express, vol. 11, no. 1, pp. 54--60, 2003.
    16. Y. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, “Image reconstruction for in-line holography with the Yang-Gu algorithm,” Appl. Opt., vol. 42, no. 32, pp. 6452--6457, 2003.
    17. Y. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, “Whole optical wave field reconstruction from double or multi in-line holograms by phase retrieval algorithm,” Opt. Express, vol. 11, no. 24, pp. 3234--3241, 2003.
  18. 2002

    1. Th. Bothe, W. Osten, A. Gesierich, and W. Jüptner, “Compact 3D-Camera,” vol. 4778, pp. 48–59, 2002.
    2. Th. Bothe, W. Li, W. Osten, and W. Jüptner, “Generation and evaluation of object adapted inverse fringe patterns. Proc. Intern Symposium Photonics in Measurement,” pp. 299–304, 2002.
    3. C. Falldorf, W. Osten, E. Kolenovic, and W. P. O. Jueptner, “Features of multiband speckle shearography,” Proceedings of SPIE - The International Society for Optical Engineering, Jul. 2002.
    4. T. Haist and H. J. Tiziani, “Color-coded Object-adapted Fringe Projection for Two- and Threedimensional Quality Control,” Technisches Messen, vol. 69, pp. 367–373, 2002.
    5. T. Haist and H. J. Tiziani, “Color-coded Object-adapted Fringe Projection for Two- and Threedimensional Quality Control,” Technisches Messen, vol. 69, pp. 367–373, Jan. 2002.
    6. F. Kallmeyer et al., “Optical processing of interferometric fringes and detection of faults by wavelet filtering,” VDI Berichte, vol. 1694, pp. 35–40, Jan. 2002.
    7. F. Kallmeyer et al., “Optical processing for the detection of faults in interferometric patterns,” in Interferometry XI: Techniques and Analysis, 2002, vol. 4777.
    8. J. Kauffmann and H. Tiziani, “Temporal speckle pattern interferometry for vibration measurement,” Proceedings of SPIE - The International Society for Optical Engineering, pp. 133–136, May 2002.
    9. D. Kayser, Th. Bothe, and W. Osten, “An integrated measurement system for the inspection of extended surfaces in industrial quality control. Proc. Intern Symposium Photonics in Measurement,” vol. 1694, 2002.
    10. D. Kayser, Th. Bothe, and W. Osten, “Scaled multisensor inspection of extended surfaces for industrial quality control,” vol. 4777, 2002.
    11. N. Kerwien, M. Totzeck, A. Tavrov, and H. J. Tiziani, “Hochauflösender quantitativer Nomarski Interferenzkontrast mit Polarisationskorrektur,” 2002.
    12. E. Kolenovic, S. Lai, W. Osten, and W. Jüptner, “A miniaturized digital holographic endoscopic system for shape and deformation measurement,” vol. 1694, 2002.
    13. S. Lai, E. Kolenovic, W. Osten, and W. P. O. Jueptner, “deformation and 3D-shape measurement system based on phase-shifting digital holography,” in Third International Conference on Experimental Mechanics, 2002, vol. 4567.
    14. R. Legarda-Saenz, W. Osten, and W. Jueptner, “Improvement of the regularized phase tracking technique for the processing of nonnormalized fringe patterns,” Appl. Opt., vol. 41, no. 26, pp. 5519--5526, 2002.
    15. J. Liesener, L. Seifert, and H. J. Tiziani, “Adaptiver Shack-Hartmann-Sensor mit LCD-Mikrolinsen Poster,” 2002.
    16. W. Osten, T. Baumbach, C. Falldorf, M. K. Kalms, and W. P. O. Jueptner, “Progress with the implementation of a shearography system for the testing of technical components,” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4900, Jul. 2002.
    17. W. Osten, F. Elandaloussi, and U. Mieth, “Trends for solution of identification problems in holographic non-destructive testing (HNDT),” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4900, Jul. 2002.
    18. W. Osten, T. Baumbach, and W. Jüptner, “Comparative digital holography,” Opt. Lett., vol. 27, no. 20, pp. 1764--1766, 2002.
    19. G. Pedrini and H. J. Tiziani, “Short-coherence digital microscopy by use of a lensless holographic imaging system,” Appl. Opt., vol. 41, no. 22, pp. 4489--4496, 2002.
    20. G. Pedrini, H. J. Tiziani, and I. Alexeenko, “Digital-holographic interferometry with an image-intensifier system,” Appl. Opt., vol. 41, no. 4, pp. 648--653, 2002.
    21. G. Pedrini, S. Schedin, and H. J. Tiziani, “Pulsed digital holography combined with laser vibrometry for 3D measurements of vibrating objects,” Optics and Lasers in Engineering, vol. 38, pp. 117–129, Sep. 2002.
    22. G. Pedrini, I. Alexeenko, M. Gusev, and H. J. Tiziani, “Vibration measurements of hidden object surfaces by using holographic endoscopes,” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4827, pp. 315–322, Apr. 2002.
    23. G. Pedrini and H. J. Tiziani, “Short-coherence digital microscopy by use of a lensless holographic imaging system,” Appl. Opt., vol. 41, no. 22, pp. 4489--4496, 2002.
    24. G. Pedrini, S. Schedin, and H. J. Tiziani, “Pulsed digital holography combined with laser vibrometry for 3D measurements of vibrating objects,” Optics and Lasers in Engineering, vol. 38, pp. 117–129, Sep. 2002.
    25. G. Pedrini, H. J. Tiziani, and I. Alexeenko, “Digital-holographic interferometry with an image-intensifier system,” Appl. Opt., vol. 41, no. 4, pp. 648--653, 2002.
    26. K.-P. Proll, J.-M. Nivet, C. Voland, and H. J. Tiziani, “Enhancement of the dynamic range of the detected intensity in an optical measurement system by a three-channel technique,” Appl. Opt., vol. 41, no. 1, pp. 130--135, 2002.
    27. K.-P. Proll, J.-M. Nivet, C. Voland, and H. J. Tiziani, “Enhancement of the dynamic range of the detected intensity in an optical measurement system by a three-channel technique,” Appl. Opt., vol. 41, no. 1, pp. 130--135, 2002.
    28. C. Pruss, S. Reichelt, H. J. Tiziani, and V. Korolkov, “Metrological features of diffractive high-efficiency objectives for laser interferometry,” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4900, Jul. 2002.
    29. S. Reichelt, H. J. Tiziani, and R. Freimann, “Interferometrischer Absoluttest von Fresnelschen Zonenplatten,” 2002.
    30. S. Reichelt, C. Pruss, and H. J. Tiziani, “Interferometrische Absolutmessung von Asphären,” 2002.
    31. S. Reichelt, C. Pruss, and H. J. Tiziani, “Specification and characterization of CGHs for interferometrical optical testing,” in Proceedings of SPIE - The International Society for Optical Engineering, 2002, vol. 4778.
    32. S. Reichelt, C. Pruss, and H. J. Tiziani, “New design techniques and calibration methods for CGH-null testing of aspheric surfaces,” in Proceedings of SPIE - The International Society for Optical Engineering, 2002, vol. 4778.
    33. S. Reichelt, M. Daffner, H. Tiziani, and R. Freimann, “Wavefront aberrations of rotationally symmetric CGHs fabricated by a polar coordinate laser plotter,” Journal of Modern Optics, vol. 49, pp. 1069–1087, Jun. 2002.
    34. S. Reichelt, M. Daffner, H. Tiziani, and R. Freimann, “Wavefront aberrations of rotationally symmetric CGHs fabricated by a polar coordinate laser plotter,” Journal of Modern Optics, vol. 49, pp. 1069–1087, Jun. 2002.
    35. M. Rocktäschel and H. J. Tiziani, “Limitations of the Shack–Hartmann sensor for testing optical aspherics,” Optics and Laser Technology - OPT LASER TECHNOL, vol. 34, pp. 631–637, Nov. 2002.
    36. M. Rocktäschel and H. J. Tiziani, “Limitations of the Shack–Hartmann sensor for testing optical aspherics,” Optics and Laser Technology - OPT LASER TECHNOL, vol. 34, pp. 631–637, Nov. 2002.
    37. A. K. Ruprecht, T. F. Wiesendanger, and H. J. Tiziani, “Signal evaluation for high-speed confocal measurements,” Appl. Opt., vol. 41, no. 35, pp. 7410--7415, 2002.
    38. A. K. Ruprecht, T. F. Wiesendanger, and H. J. Tiziani, “Signal evaluation for high-speed confocal measurements,” Appl. Opt., vol. 41, no. 35, pp. 7410--7415, 2002.
    39. A. Tavrov, M. Totzeck, N. Kerwien, B. R., and H. J. Tiziani, “High-resolution Jones-matrix microscopy by means of interferometry and polarimetry Poster,” 2002.
    40. A. Tavrov, M. Totzeck, N. Kerwien, and H. J. Tiziani, “Rigorous coupled-wave analysis calculus of submicrometer interference pattern and resolving edge position versus signal-to-noise ratio,” Optical Engineering - OPT ENG, vol. 41, pp. 1886–1892, Aug. 2002.
    41. A. Tavrov, M. Totzeck, N. Kerwien, and H. J. Tiziani, “Rigorous coupled-wave analysis calculus of submicrometer interference pattern and resolving edge position versus signal-to-noise ratio,” Optical Engineering - OPT ENG, vol. 41, pp. 1886–1892, Aug. 2002.
    42. M. Totzeck, N. Kerwien, A. Tavrov, and H. J. Tiziani, “DUV-Mikroskpie: Mehr als nur eine Wellenlängenskalierung,” 2002.
    43. M. Totzeck, A. Tavrov, N. Kerwien, and H. J. Tiziani, “Inspection of sub-wavelength structures and zero-order gratings using polarization interferometry,” in Proceedings of SPIE - The International Society for Optical Engineering, 2002, vol. 4777.
    44. M. Totzeck, N. Kerwien, A. Tavrov, E. Rosenthal, and H. J. Tiziani, “Quantitative Zernike phase-contrast microscopy by use of structured birefringent pupil-filters and phase-shift evaluation,” in Proceedings of SPIE - The International Society for Optical Engineering, 2002, vol. 4777, pp. 1–11.
    45. G. Wernicke et al., “Anwendung von Wavelet-Filtern in einem optischen Prozessor zur automatischen Fehlererkennung in Interferogrammen (The Application of Wavelet Filters in Convolution Processors for the Automatic Detection of Faults in Fringe Pattern Systems),” Tm-technisches Messen, vol. 69, Jan. 2002.
    46. T. Wiesendanger, Y. Yasuno, A. Ruprecht, M. Totzeck, and H. J. Tiziani, “Charakterisierung von Mikrooptikarrays durch Auswertung der axialen konfokalen Systemantwort,” 2002.
    47. T. Wiesendanger, Y. Yasuno, A. Ruprecht, T. Yatagai, and H. J. Tiziani, “Characterization of microoptic arrays by evaluation of the confocal response in axial direction,” 2002.
    48. R. Windecker, K. Körner, M. Fleischer, and H. J. Tiziani, “Signalverarbeitung bei tiefenscannenden 3D-Sensoren für neue industrielle Anwendung,” vol. 69, 2002.
    49. R. Windecker, K. Körner, M. Fleischer, and T. H.J., “Signalverarbeitung bei tiefenscannenden 3D-Sensoren für neue industrielle Anwendungen,” Technisches Messen, vol. 69, pp. 251–257, 2002.
    50. Y. Yasuno, T. Yatagai, T. F. Wiesendanger, A. K. Ruprecht, and H. J. Tiziani, “Aberration measurement from confocal axial intensity response using neural network,” Opt. Express, vol. 10, no. 25, pp. 1451--1457, 2002.
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